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Low energy loss spectroscopy: applications in materials

Published online by Cambridge University Press:  17 November 2003

M.-C. Cheynet
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Abstract

The low energy loss spectroscopy interpretes the signal resulting from the excitation of the valence or conduction electrons of a material under the impact with an electron beam. The analysis of this signal in terms of plasmon energy, low-loss function or dielectric function gives a lot of informations about the electronic structure and the chemical bonding of the sample. When this spectroscopy is connected with a field emission gun scanning transmission electron microscope (STEM-VG HB5O1) it constitutes a very relevant tool to solve material problems for which nanoanalytical investigations are of prime importance. These performances are illustrated by three examples.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 5: Science et Génie des MatériauxMatériaux et microscopies , May 2003 , pp. 523 - 534
Copyright
© La Revue de Métallurgie, 2003

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