Microscopy and Microanalysis: Volume 12 - Issue S02

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Volume 12 - Issue S02 - August 2006

Contents

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Microscopy in Nanoscience and Nanotechnology

Research Article

Magnetic Nanostructures: Lorentz TEM Studies of Magnetization Reversal Processes
A Petford-Long, A Kohn, T Bromwich, A Eggeman
Published online by Cambridge University Press:

31 July 2006, pp. 42-43
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Novel Approaches to Nanofabrication Using an Environmental STEM
PA Crozier
Published online by Cambridge University Press:

31 July 2006, pp. 44-45
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Imaging of Hafnium Atoms and Clusters in Silicon Dioxide
DO Klenov, TE Mates, S Stemmer
Published online by Cambridge University Press:

31 July 2006, pp. 46-47
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment

Research Article

Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities
PL Gai
Published online by Cambridge University Press:

31 July 2006, pp. 48-49
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Observation of Pt Atoms, Clusters and Rafts on Oxide Supports, by Sub-Ångström Z-Contrast Imaging in an Aberration-Corrected STEM/TEM
DA Blom, SA Bradley, W Sinkler, LF Allard
Published online by Cambridge University Press:

31 July 2006, pp. 50-51
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

3D-TEM Study of Gamma Alumina Catalyst Supports
W Sinkler, SA Bradley, U Ziese, KP de Jong
Published online by Cambridge University Press:

31 July 2006, pp. 52-53
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos

Research Article

A New Method for Quantitative X-ray Microanalysis on a FEG-SEM
P Horny, R Gauvin, H Campbell
Published online by Cambridge University Press:

31 July 2006, pp. 54-55
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Relationship Between Quartz Trace Elements and SEM-Cathodoluminescence Textures Revealed Using WDS Mapping Techniques
H Lowers, B Rusk
Published online by Cambridge University Press:

31 July 2006, pp. 56-57
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Development of Ultra-Soft X-ray Spectrometer for Electron Probe Microanalysis
S Fukushima, T Kimura, T Ogiwara, K Tsukamoto, T Tazawa, S Tanuma
Published online by Cambridge University Press:

31 July 2006, pp. 58-59
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

50th Anniversary of Observation of Dislocations

Research Article

Characterization of Dislocations with a Local Electrode Atom Probe: Practical Considerations and Limitations
M Miller
Published online by Cambridge University Press:

31 July 2006, pp. 60-61
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

In-situ TEM Deformation Study of Dislocation-Precipitate Interactions in Al Alloys
B Clark, G Liu, I Robertson
Published online by Cambridge University Press:

31 July 2006, pp. 62-63
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Dissociation of Grain Boundary Dissociation in Oxide Ceramics
Y Ikuhara, A Nakamura, T Yamamoto
Published online by Cambridge University Press:

31 July 2006, pp. 64-65
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Visualizing and Measuring Mechanical Behavior at Small Length Scales

Research Article

Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction
A Wilkinson, G Meaden, D Dingley
Published online by Cambridge University Press:

31 July 2006, pp. 66-67
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

In-situ Micro-sample Mechanical Testing in the SEM
R Wheeler, P Shade, M Uchic, R Kerns, H Fraser
Published online by Cambridge University Press:

31 July 2006, pp. 68-69
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope
OL Warren, SA S Asif, AM Minor, Z Shan, EA Stach
Published online by Cambridge University Press:

31 July 2006, pp. 70-71
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Microscopy and Microanalysis of Magnetic Materials

Research Article

Imaging of Domain Structures and Magnetization Dynamics Using X-ray Photoemission Electron Microscopy (X-PEEM)
A Scholl
Published online by Cambridge University Press:

31 July 2006, pp. 72-73
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Interactions Between Magnetic Domain Walls and APBs in Ni2MnGa
SP Venkateswaran, NT Nuhfer, M De Graef
Published online by Cambridge University Press:

31 July 2006, pp. 74-75
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Information Storage Technology: The Role of the TEM
R Sinclair, J Risner, U Kwon
Published online by Cambridge University Press:

31 July 2006, pp. 76-77
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Calibration and Test Structures for Nanometrology
J Kim, S Deo, K Jalhadi, S-Y Lee, D Joy
Published online by Cambridge University Press:

31 July 2006, pp. 78-79
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Integration of Large-Chamber Scanning Electron Microscopy and Image-Stitching Techniques to Characterize Full-Sized Components
JJ Frafjord, S Dekanich, A Mathews III, T Savage, C Kammerud, B Abidi, D Page, M Abidi
Published online by Cambridge University Press:

31 July 2006, pp. 80-81
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 2 of 45

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Microscopy and Microanalysis

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Volume 12 - Issue S02 - August 2006

Microscopy in Nanoscience and Nanotechnology

Research Article

Magnetic Nanostructures: Lorentz TEM Studies of Magnetization Reversal Processes

Novel Approaches to Nanofabrication Using an Environmental STEM

Imaging of Hafnium Atoms and Clusters in Silicon Dioxide

In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment

Research Article

Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities

Observation of Pt Atoms, Clusters and Rafts on Oxide Supports, by Sub-Ångström Z-Contrast Imaging in an Aberration-Corrected STEM/TEM

3D-TEM Study of Gamma Alumina Catalyst Supports

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos

Research Article

A New Method for Quantitative X-ray Microanalysis on a FEG-SEM

Relationship Between Quartz Trace Elements and SEM-Cathodoluminescence Textures Revealed Using WDS Mapping Techniques

Development of Ultra-Soft X-ray Spectrometer for Electron Probe Microanalysis

50th Anniversary of Observation of Dislocations

Research Article

Characterization of Dislocations with a Local Electrode Atom Probe: Practical Considerations and Limitations

In-situ TEM Deformation Study of Dislocation-Precipitate Interactions in Al Alloys

Dissociation of Grain Boundary Dissociation in Oxide Ceramics

Visualizing and Measuring Mechanical Behavior at Small Length Scales

Research Article

Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction

In-situ Micro-sample Mechanical Testing in the SEM

From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

Microscopy and Microanalysis of Magnetic Materials

Research Article

Imaging of Domain Structures and Magnetization Dynamics Using X-ray Photoemission Electron Microscopy (X-PEEM)

Interactions Between Magnetic Domain Walls and APBs in Ni2MnGa

Information Storage Technology: The Role of the TEM

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Calibration and Test Structures for Nanometrology

Integration of Large-Chamber Scanning Electron Microscopy and Image-Stitching Techniques to Characterize Full-Sized Components

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 12 - Issue S02 - August 2006

Microscopy in Nanoscience and Nanotechnology

Research Article

In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment

Research Article

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos

Research Article

50th Anniversary of Observation of Dislocations

Research Article

Visualizing and Measuring Mechanical Behavior at Small Length Scales

Research Article

Microscopy and Microanalysis of Magnetic Materials

Research Article

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article