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Microscopy and Microanalysis
Volume 12 Issue s02

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Microscopy and Microanalysis

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Microscopy in Nanoscience and Nanotechnology (142)

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences (54)

Electron Energy Loss Spectroscopy for the 21st Century (43)

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos (38)

Cell Biology and Microscopy: A symposium dedicated to the memory of Hans Ris (35)

Tomography in Biological and Materials Sciences (35)

In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment (33)

Applications in Materials Science and Engineering (32)

Microscopic Molecular Machines (29)

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping (27)

Advances in STEM Techniques for Materials Characterization (25)

Pathology (23)

Microscopy and Microanalysis of Magnetic Materials (21)

Visualizing and Measuring Mechanical Behavior at Small Length Scales (20)

50th Anniversary of Observation of Dislocations (19)

Atom Probe Field Ion Microscopy (17)

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials (17)

Advances in Microscopy of Photosynthetic Organisms: An Integrative Understanding of Cell Structure and Function (16)

Approaching the 1-Å barrier in the CTEM (16)

Cathodoluminescence in the Scanning Electron Microscope (16)

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM (16)

Microbes and Materials: Surveillance of the Unknown with Emphasis on Emerging Diseases and Terrorist Events (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences (16)

Digital Imaging and Measurements (15)

Surface Microscopy and Microanalysis in Materials and Biological Systems (15)

Advances in Low Voltage Microscopy and Microanalysis (13)

General Metallographic Techniques & Applications (12)

Microscopy, Imaging and Training in the Digital Age (12)

TEM Automation (11)

High Resolution Labeling (10)

Multi-length Scale Characterization of Materials from Nanometer to Millimeter (10)

Failure Analysis & Prevention (8)

Optical Instrumentation (8)

Special Topics: Forensic Science – Solving the Whodunits with Microanalysis (8)

Ultrafast Electron Microscopy (8)

Metallographic Preparation & Analysis of Polymer Materials (7)

Analytical Limits in the Analysis of Nanotechnology (6)

Biomaterials (5)

Contamination Control in Electron and Ion Microscopy (5)

Electron Holography (5)

Main Platform Session: Optical Methods (5)

Semiconductors (4)

Advances in Instrumentation and Techniques (3)

Instrumentation Performance and Design (2)

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution (1)

From fundamentals to the cutting edge: CCD technology for Digital Image Capture on Transmission Electron Microscopes. (1)

How to convert 2D serial sectioning images into a 3D dataset (1)

How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3-D (1)

IMOD - A tool for 3-D reconstruction by TEM tomography (1)

IMS Henry Clifton Sorby Award and Lecture (1)

Microwave Processing in a Modern Microscopy Facility (1)

Recent Advances in Atom Probe Tomography and Applications to Understanding Nanomaterials (1)

Scanning Electron Microscopy (1)

Serial sectioning in the micron-plus range, and modern techniques for automation (1)

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Microscopy and Microanalysis
ISSN: 1431-9276

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< Back to all issues

Volume 12 - Issue S02 - August 2006

Contents

Page 45 of 45

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Optical Instrumentation

Abstract

Orientation-Independent Differential Interference Contrast Microscopy
M Shribak, S Inoue
Published online by Cambridge University Press:

31 July 2006, pp. 1768-1769
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Searching for Planets Orbiting Distant Suns: Why Would You Look Through a Microscope?
JL Mey, BR Oppenheimer
Published online by Cambridge University Press:

31 July 2006, pp. 1770-1771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Quantifying the Effects of Light Scattering in a Confocal Microscopy Imaging System
D Pasternack
Published online by Cambridge University Press:

31 July 2006, pp. 1772-1773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Instrumentation Performance and Design

Abstract

Absolute Thickness Imaging of PMMA Layer on Corrugated Transparent Substrate by Scanning White Light Interference Microscope
M Jobin, R Foschia
Published online by Cambridge University Press:

31 July 2006, pp. 1774-1775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Thermal Expansion Characteristics of Hexaboride Electron Sources and Other Factors Impacting Beam Stability
L Southall, K Kagarice, A Thron, P Canepa, W Mackie
Published online by Cambridge University Press:

31 July 2006, pp. 1776-1777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Advances in Instrumentation and Techniques

Abstract

Improved Sectioning of High-Impact Polystyrene and Styrene/Acrylate Latex Using an Oscillating Diamond Knife for Transmission Electron Microscopy
J Harris, B Vastenhout
Published online by Cambridge University Press:

31 July 2006, pp. 1778-1779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Development of New Analytical Approaches by a 300 keV CFE-TEM/STEM
Y Taniguchi, T Furutsu, M Otsuka, K Nakamura, T Hashimoto, M Konno, T Yaguchi, S Terada, K Kaji, M Koguchi, T Matsumoto
Published online by Cambridge University Press:

31 July 2006, pp. 1780-1781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

A Different Kind of Microscopy: Analyzing Features with an Automated Electron Beam
F Schamber, CK van Beek
Published online by Cambridge University Press:

31 July 2006, pp. 1782-1783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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