Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Oliver Wells Memorial Symposium on the Scanning Electron Microscope

Abstract

Spatial Resolution of Scanning Electron Microscopy without a Vacuum Chamber

A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology

Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image

A Novel Transmission Electron Imaging Technique for Observation of Whole Cells

Interpretation of Energy-Filtered BSE Images at Ultra Low Voltage Conditions

SEM Image Observation Using an Electron Energy and Electron Take-off Angle Filtered Detector

Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM

Measuring the Strain Sensitivity in Si (001) Electron Channeling Patterns Using Higher-order Laue Zone Line Shifts

Quantifying the Effect of Drilling Fluid Contamination on Cement-Formation Hydraulic Bond Using Scanning Electron Microscopy and Energy Dispersive Spectroscopy

The Application of GPGPU to Automatic Electron Gun Alignment in the Scanning Electron Microscope

Use of HfC(310) as a High Brightness Electron Sources for Advanced Imaging Applications

Advances in Imaging and Spectroscopy in STEM

Abstract

Tracking Dopant Diffusion Pathways inside Bulk Materials

Three-Dimensional Observation of Dopant Atoms in Quantitative Scanning Transmission Electron Microscopy

Study of Oxygen Distortions in Titanate - Manganite Interfaces by Aberration Corrected STEM-EELS

Chemical Analysis with Single Atom Sensitivity Using Aberration-Corrected STEM

Progress in Applications of Quantitative STEM

Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting

Recording and Using 4D-STEM Datasets in Materials Science

Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Oliver Wells Memorial Symposium on the Scanning Electron Microscope

Abstract

Advances in Imaging and Spectroscopy in STEM

Abstract