Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Exploring Phonon Signals by High Energy / High Spatial Resolution EELS

Characterization of Electron Orbital Angular Momentum Transfer to Nanoparticle Plasmon Modes

High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM

Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

Assessing and Controlling the Size, Morphology and Composition of Supported Bimetallic Catalyst Nanoparticles

Experimental and Theoretical Atomic-Resolved EELS Studies on Nitrogen Doped Single-Walled Carbon Nanotubes

Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS

Fine Structural Studies of AlGaN Laser Heterostructures with Digitally Alloyed Quantum Wells Grown on c-Al2O3 by plasma-Assisted Molecular Beam Epitaxy

Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe

Atomic-resolution Imaging Using Cs-corrected Vortex Beams

STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures

The Versatile Imaging Capabilities of Aberration-Corrected STEM

Inelastic STEM Imaging Based on Low-Loss Spectroscopy

Atomic Imaging and Spectroscopy of Two-Dimensional Materials

Imaging and Spectroscopy of Graphene/Hexagonal Boron Nitride Lateral Heterostructure Interfaces

Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials

Interfaces and Defects in Hybrid Molecular Beam Epitaxy Grown NdTiO3/SrTiO3 Heterostructures

Absorption Corrections for a Four-Quadrant SuperX EDS Detector

Grain Boundary Structure Reconstruction due toVacancies and Dopants in Oxides

Probing Atomic Scale Dynamics with STEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract