Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Strain Mapping during In-situ Deformation using a High-Speed Electron Detector

Fast Imaging of Carbon Nanotube Carpet Growth by Environmental TEM

Compression Algorithm Analysis of In-Situ (S)TEM Video: Towards Automatic Event Detection and Characterization

A06 Advanced Analytical TEM/STEM

Abstract

New Discrete Tomographic Reconstruction Method for Electron Tomography

Challenges and Opportunities in 3D Tri-gate Transistor Characterization

Robust Physical Alignment Models for Electron Tomography

Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

HAADF-STEM and Super-X™ XEDS Tomography of Complex Nano-scale Precipitates in a High Entropy Alloy, AlMo0.5NbTa0.5TiZr

Linear chemically sensitive electron tomography using DualEELS and compressed sensing

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

In-situ AFM and SEM Investigation of Slip Steps Evolving during Nanoindentation

Deep Data Analysis of Atomic Level Structure-Property Relationship in an Iron Superconductor Fe105Te075Se025

Nanoscale Photocurrent Microscopy for Thin Film Solar Cells Using Focused Electron Beam and Near-Field Optical Excitations

Faster Time-Resolved Electrostatic Force Microscopy

Correlative nanoscopy: super resolved fluorescence and atomic force microscopy towards nanoscale manipulation and multimodal investigations

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Nanomineralogy of Meteorites by Advanced Electron Microscopy: Discovering New Minerals and New Materials from the Early Solar System

Soft X-ray Emission Spectroscopy on Chemical States of 3D-Transition Metal Elements with SEM

Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!

High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Mapping Electronic Orbitals in Real Space

Excitonic Calculations of ELNES: Low Energy and High Energy Spectra

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract