Microscopy and Microanalysis: Volume 12 -

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Volume 12 - August 2006

Contents

Page 8 of 50

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Calibration and Test Structures for Nanometrology
J Kim, S Deo, K Jalhadi, S-Y Lee, D Joy
Published online by Cambridge University Press:

31 July 2006, pp. 78-79
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Integration of Large-Chamber Scanning Electron Microscopy and Image-Stitching Techniques to Characterize Full-Sized Components
JJ Frafjord, S Dekanich, A Mathews III, T Savage, C Kammerud, B Abidi, D Page, M Abidi
Published online by Cambridge University Press:

31 July 2006, pp. 80-81
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Variogram Characterization of the Length Scales of Topographic Patterns
NO Fuentes, EA Favret
Published online by Cambridge University Press:

31 July 2006, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

TEM Automation

Research Article

Advantages and Objectives of High-throughput Data Collection in Single-particle Cryo-EM
RM Glaeser, J Lee, D Typke
Published online by Cambridge University Press:

31 July 2006, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions
KJ Hayworth, N Kasthuri, R Schalek, JW Lichtman
Published online by Cambridge University Press:

31 July 2006, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Automated Acquisition of Tomographic and Random Conical Tilt Series and Real-time Reconstruction Using UCSF Tomography
SQ Zheng, MB Braunfeld, B Keszthelyi, E Branlund, JM Kollman, JW Sedat, DA Agard
Published online by Cambridge University Press:

31 July 2006, pp. 88-89
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Serial Sectioning in the Micron-plus Range and Modern Techniques for Automation
JE Spowart
Published online by Cambridge University Press:

31 July 2006, pp. 90-91
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-electron Tomography: A Powerful Analytical Tool for the Study of Cells and Organelles at Molecular Resolution
D Nicastro
Published online by Cambridge University Press:

31 July 2006, pp. 92-93
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

High Pressure Freezing: The Good, the Bad and the Ugly
K McDonald
Published online by Cambridge University Press:

31 July 2006, pp. 94-95
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Nuclear Structures in a High Resolution Cryo-SEM
P Walther, V Cordes
Published online by Cambridge University Press:

31 July 2006, pp. 96-97
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Focused Ion Beam (FIB) Preparation Methods for 3-D Biological Cryo-TEM
M Marko, C-E Hsieh, R Shalek, C Ting, C Mannella, J Frank
Published online by Cambridge University Press:

31 July 2006, pp. 98-99
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

High Pressure Freezing of Brain Tissue Slices
D Studer, S Zhao, W Graber, P Eggli, M Frotscher
Published online by Cambridge University Press:

31 July 2006, pp. 100-101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Limitations of Electron Energy-Loss Spectroscopy
R Egerton
Published online by Cambridge University Press:

31 July 2006, pp. 102-103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Detection Limits for EELS Analysis of Biological Materials
RD Leapman
Published online by Cambridge University Press:

31 July 2006, pp. 104-105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Improvement of TEM-EELS and Its Application for Materials in Semiconductor Devices
K Kimoto, K Ishizuka, Y Matsui
Published online by Cambridge University Press:

31 July 2006, pp. 106-107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Perfection in Theoretical Modeling of Electron Energy Loss Spectra: Is it attainable?
P Rez
Published online by Cambridge University Press:

31 July 2006, pp. 108-109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Response of Inhomogeneous Media to Valence Excitation by Fast Electrons
A Howie, A Rivacoba, J Garcia de Abajo
Published online by Cambridge University Press:

31 July 2006, pp. 110-111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS
RF Klie, MA Schofield, M Varela, SJ Pennycook, A Bleloch, Y Zhu
Published online by Cambridge University Press:

31 July 2006, pp. 112-113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides
G Radtke, C Maunders, S Lazar, AD Lozano-Gorrin, JE Greedan, GA Botton
Published online by Cambridge University Press:

31 July 2006, pp. 114-115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Modern Auger Electron Spectroscopy for Chemical Surface Analysis
D Paul, D Watson, J Moulder, S Bryan, S Alnabulsi
Published online by Cambridge University Press:

31 July 2006, pp. 116-117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 8 of 50

Microscopy and Microanalysis

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Volume 12 - August 2006

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

Calibration and Test Structures for Nanometrology

Integration of Large-Chamber Scanning Electron Microscopy and Image-Stitching Techniques to Characterize Full-Sized Components

Variogram Characterization of the Length Scales of Topographic Patterns

TEM Automation

Research Article

Advantages and Objectives of High-throughput Data Collection in Single-particle Cryo-EM

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

Automated Acquisition of Tomographic and Random Conical Tilt Series and Real-time Reconstruction Using UCSF Tomography

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Serial Sectioning in the Micron-plus Range and Modern Techniques for Automation

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-electron Tomography: A Powerful Analytical Tool for the Study of Cells and Organelles at Molecular Resolution

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

High Pressure Freezing: The Good, the Bad and the Ugly

Nuclear Structures in a High Resolution Cryo-SEM

Focused Ion Beam (FIB) Preparation Methods for 3-D Biological Cryo-TEM

High Pressure Freezing of Brain Tissue Slices

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Limitations of Electron Energy-Loss Spectroscopy

Detection Limits for EELS Analysis of Biological Materials

Improvement of TEM-EELS and Its Application for Materials in Semiconductor Devices

Perfection in Theoretical Modeling of Electron Energy Loss Spectra: Is it attainable?

Response of Inhomogeneous Media to Valence Excitation by Fast Electrons

Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS

Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Modern Auger Electron Spectroscopy for Chemical Surface Analysis

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 12 - August 2006

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Research Article

TEM Automation

Research Article

Serial sectioning in the micron-plus range, and modern techniques for automation

Research Article

Cryo-electron tomography: a powerful analytical tool to study cells and organelles at molecular resolution

Research Article

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Research Article

Electron Energy Loss Spectroscopy for the 21st Century

Research Article

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article