Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Trace Element Detection by X-Ray Fluorescence
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- 02 July 2020, pp. 348-349
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High Resolution X-ray Microscopy of Frozen Hydrated Samples
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- 02 July 2020, pp. 350-351
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High Spatial Resolution Soft X-Ray Microscopy and Microanalysis of Thick and Hydrated Materials
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- 02 July 2020, pp. 352-353
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Imaging, Spectroscopy and Tomography of Frozen Hydrated Specimens With the Cryo Scanning Transmission X-Ray Microscope at The NSLS
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- 02 July 2020, pp. 354-355
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Mapping the Organic and Inorganic Components of Normal and Osteoporotic Bone Using Nexafs.
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- 02 July 2020, pp. 356-357
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Mephisto: A Novel Synchrotron Imaging Photoelectron Spectromicroscope
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- 02 July 2020, pp. 358-359
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Quantitative Non-Interferometric X-Ray Phase Imaging
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- 02 July 2020, pp. 360-361
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A State-of-the-art X-Ray Microprobe and its Applications at the Advanced Photon Source
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- 02 July 2020, pp. 362-363
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Spatially-Resolved X-Ray Absorption fine Structure (XAFS) Spectroscopy Using Undulator Radiation Focused by Dynamically-Bent Elliptical Mirrors
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- 02 July 2020, pp. 364-365
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Precise X-Ray Microfluorescence Measurements of Sr/Ca Ratios In Corals For Paleotemperature Analysis
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- 02 July 2020, pp. 366-367
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Applications of Laboratory-Based X-Ray Microfluorescence Analysis in Archaeometry
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- 02 July 2020, pp. 368-369
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X-Ray Radiation Damage of Polymers in a Scanning Transmission X-Ray Microscope
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- 02 July 2020, pp. 370-371
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Characterizing Inhomogeneous Deformation Substructure in Large Single Crystals by Microscopy and XRD - A Synergystic Analysis
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- 02 July 2020, pp. 372-373
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X-Ray Microscopy Developments at the ESRF
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- 02 July 2020, pp. 374-375
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Bragg and Fresnel Diffraction Imaging Using Highly Coherent X-Rays
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- 02 July 2020, pp. 376-377
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Comparing Elemental Sensitivities Obtained With an Aperture and a Monolithic Polycapillary Optic Using a Commercial Micro-X-Ray Fluorescence (MXRF) Instrument
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- 02 July 2020, pp. 380-381
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Advances in Instrumentation and Performance
High Resolution Transmission Electron Microscopy at Zero Cs
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- 02 July 2020, pp. 382-383
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First Application of a Spherical-Aberration Corrected Microscope Material Science
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- 02 July 2020, pp. 384-385
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Experimental Gun Brightness Measurements on a 300 kV CFEG
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- 02 July 2020, pp. 386-387
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Measuring and Tuning TEM Energy Filter Performance
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- 02 July 2020, pp. 388-389
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