Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-27T15:10:15.998Z Has data issue: false hasContentIssue false
  • English
  • Français

Size-controlled Preparation of Alkylamine-stabilized Copper Fine Particles from Cupric Oxide (CuO) Micro-particles

Published online by Cambridge University Press:  01 February 2019

Tetsu Yonezawa Open the ORCID record for Tetsu Yonezawa [Opens in a new window] ,
Jiajia Shi ,
Hiroki Tsukamoto  and
Mai Thanh Nguyen
Tetsu Yonezawa*
Affiliation:
Division of Materials Science and Engineering, Faculty of Engineering, Hokkaido University, Kita 13 Nishi 8, Kita-ku, Sapporo, Hokkaido060-8628
Jiajia Shi
Affiliation:
Division of Materials Science and Engineering, Faculty of Engineering, Hokkaido University, Kita 13 Nishi 8, Kita-ku, Sapporo, Hokkaido060-8628
Hiroki Tsukamoto
Affiliation:
Division of Materials Science and Engineering, Faculty of Engineering, Hokkaido University, Kita 13 Nishi 8, Kita-ku, Sapporo, Hokkaido060-8628
Mai Thanh Nguyen
Affiliation:
Division of Materials Science and Engineering, Faculty of Engineering, Hokkaido University, Kita 13 Nishi 8, Kita-ku, Sapporo, Hokkaido060-8628
*
*(Email: tetsu@eng.hokudai.ac.jp)
Get access

Abstract

Size control of copper fine particles is highly important for their application for conductive materials. In this study, easy size tuning of the copper fine particles coated by n-hexylamine was achieved via controlling the ratio of n-hexylamine and the precursor CuO. The obtained particles were stable and had a hydrophobic surface. TG-DTA measurement revealed the formation of thin layer of n-hexylamine on the particles.

Keywords

chemical synthesisCupowderscanning electron microscopy (SEM)electronic material
Type
Articles
Information
MRS Advances , Volume 4 , Issue 7: Nanomaterials , 2019 , pp. 413 - 418
Copyright
Copyright © Materials Research Society 2019 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Toshima, N. and Yonezawa, T., New J. Chem. 22, 1179 (1998)CrossRefGoogle Scholar
Ishida, Y., Corpuz, R. D., and Yonezawa, T., Acc. Chem. Res. 50, 2986 (2017)CrossRefGoogle Scholar
Nguyen, M. T. and Yonezawa, T., Sci. Tech. Adv. Mater. in press. DOI: 10.1080/14686996.2018.1542926.CrossRefGoogle Scholar
Nishimoto, M., Abe, S., and Yonezawa, T., New J. Chem. 42, 14493 (2018)CrossRefGoogle Scholar
Yonezawa, T., Čempel, D., and Nguyen, M. T., Bull. Chem. Soc. Jpn. in press. DOI: 10.1246/bcsj.20180285.CrossRefGoogle Scholar
Tomonari, M., Ida, K., Yamashita, H., and Yonezawa, T., J. Nanosci. Nanotech. 8, 2468 (2008)CrossRefGoogle Scholar
Yonezawa, T., Tsukamoto, H., and Nguyen, M. T., Adv. Powder Tech. 28, 1966 (2017)CrossRefGoogle Scholar
Kamyshny, A. and Magdassi, S., Small 10, 3515 (2014)CrossRefGoogle Scholar
Yong, Y., Nguyen, M. T., Yonezawa, T., Asano, T., Matsubara, M., Tsukamoto, H., Liao, Y.-C., Zhang, T., Isobe, S., and Nakagawa, Y., J. Mater. Chem. C 5, 1033 (2017)CrossRefGoogle Scholar
Abhinav, V., Krishna Rao, K. V., Karthik, R. P. S., and Singh, S. P., RSC Adv. 5, 63985 (2015)CrossRefGoogle Scholar
Ali Ben Aissa, M., Tremblay, B., Andrieux-Ledier, A., Maisonhaute, E., Raouafi, N., and Courty, A., Nanoscale 7, 3189 (2015)CrossRefGoogle Scholar
Leff, D. V., Ohara, P. C., Heath, J. R., and Gelbert, W. M., J. Phys. Chem. 99, 7036 (1995)CrossRefGoogle Scholar
Yonezawa, T., Yasui, K., and Kimizuka, N., Langmuir 17, 271 (2001)CrossRefGoogle Scholar
NIH Pubchem Open Chemistry Database. https://pubchem.ncbi.nlm.nih.gov/compound/Hexylamine (accessed on 2 Oct. 2018)Google Scholar