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In Operando XANES & XRD Investigation into the Rate-Dependent Transport Properties of Lithium Iron Silicate Cathodes

Published online by Cambridge University Press:  06 February 2017

Zachary N. Arthur ,
Hsien-Chieh Chiu ,
Xia Lu ,
Ning Chen ,
Vincent Emond ,
George P. Demopoulos  and
De-Tong Jiang
Zachary N. Arthur
Affiliation:
Department of Physics, University of Guelph, Guelph, ON N1G 2W1, Canada
Hsien-Chieh Chiu
Affiliation:
Department of Materials Engineering, McGill University, Montreal, QC H3A 0C5, Canada
Xia Lu
Affiliation:
Department of Materials Engineering, McGill University, Montreal, QC H3A 0C5, Canada
Ning Chen
Affiliation:
Material and Chemical Sciences, Canadian Light Source, Saskatoon, SK S7N 2V3, Canada
Vincent Emond
Affiliation:
Department of Physics, University of Guelph, Guelph, ON N1G 2W1, Canada
George P. Demopoulos
Affiliation:
Department of Materials Engineering, McGill University, Montreal, QC H3A 0C5, Canada
De-Tong Jiang*
Affiliation:
Department of Physics, University of Guelph, Guelph, ON N1G 2W1, Canada
*
*corresponding author: djiang@uoguelph.ca
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Abstract

The majority of improvements to LIB technology have come through the development of new novel cathode materials. One promising cathode material is Li2FeSiO4 (LFS), desirable for its low cost and high theoretical capacity. However, the ionic conduction and transport mechanisms within this material are still not well understood, and require further investigation to improve upon cycling rate performance. To this end combined measurements of XRD & XANES have been performed in operando on LFS during electrochemical cycling, i.e. at selected electrochemical states of charge during the formation cycle the crystalline structure and the transition metal oxidation state as well as the site symmetry were characterized via the two aforementioned techniques. These in operando measurements expose once more a charging rate-dependent phase evolution during the formation cycle, which can be well characterized using a simplified equivalent circuit analogue.

Keywords

x-ray diffraction (XRD)extended x-ray absorption fine structure(EXAFS)electrical properties
Type
Articles
Information
MRS Advances , Volume 2 , Issue 7: Electrochemistry , 2017 , pp. 419 - 424
Copyright
Copyright © Materials Research Society 2017 

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References

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