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Mapping of Nanoscale Mechanical Properties of Polymers in Quasi-static and Oscillatory Atomic Force Microscopy Modes

Published online by Cambridge University Press:  29 July 2016

Sergei Magonov ,
Marko Surtchev ,
John Alexander ,
Ivan Malovichko  and
Sergey Belikov
Sergei Magonov*
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
Marko Surtchev
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
John Alexander
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
Ivan Malovichko
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
Sergey Belikov
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
*
*(Email: magonov@ntmdt.us)
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Abstract

Recent advances in studies of local mechanical properties of polymers with different atomic force microscopy techniques (contact, Hybrid and amplitude modulation modes) are described in interplay between experiment and theory. Analysis of force curves and time dependencies of probe response to sample compliance, which were recorded on a number of polymer materials at various temperatures, leads to quantitative mapping of specific mechanical properties (elastic modulus, work of adhesion, etc). High spatial resolution of elastic modulus mapping (10-20 nm) is illustrated in measurements of lamellar structures of several polymers. Challenges of examination of viscoelastic properties are pointed out and a possible solution is presented.

Keywords

scanning probe microscopy (SPM)polymerviscoelasticity
Type
Articles
Information
MRS Advances , Volume 1 , Issue 40: Characterization and Modeling of Materials , 2016 , pp. 2763 - 2768
Copyright
Copyright © Materials Research Society 2016 

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References

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