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Measurements of trapped-ion heating rates with exchangeable surfaces in close proximity

Published online by Cambridge University Press:  12 January 2017

D. A. Hite ,
K. S. McKay ,
S. Kotler ,
D. Leibfried ,
D. J. Wineland  and
D. P. Pappas
D. A. Hite*
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 U.S.A
K. S. McKay
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 U.S.A
S. Kotler
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 U.S.A
D. Leibfried
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 U.S.A
D. J. Wineland
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 U.S.A
D. P. Pappas
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305 U.S.A
*
*(Email: dustin.hite@nist.gov)
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Abstract

Electric-field noise from the surfaces of ion-trap electrodes couples to the ion’s charge causing heating of the ion’s motional modes. This heating limits the fidelity of quantum gates implemented in quantum information processing experiments. The exact mechanism that gives rise to electric-field noise from surfaces is not well-understood and remains an active area of research. In this work, we detail experiments intended to measure ion motional heating rates with exchangeable surfaces positioned in close proximity to the ion, as a sensor to electric-field noise. We have prepared samples with various surface conditions, characterized in situ with scanned probe microscopy and electron spectroscopy, ranging in degrees of cleanliness and structural order. The heating-rate data, however, show no significant differences between the disparate surfaces that were probed. These results suggest that the driving mechanism for electric-field noise from surfaces is due to more than just thermal excitations alone.

Keywords

Auger electron spectroscopy (AES)scanning tunneling microscopy (STM)ion-solid interactions
Type
Articles
Information
MRS Advances , Volume 2 , Issue 41: Electronics, Magnetics and Photonics , 2017 , pp. 2189 - 2197
Copyright
Copyright © Materials Research Society 2017 

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References

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