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Size decrease of detonation nanodiamonds by air annealing investigated by AFM

Published online by Cambridge University Press:  19 January 2016

Stepan Stehlik ,
Daria Miliaieva ,
Marian Varga ,
Alexander Kromka  and
Bohuslav Rezek
Stepan Stehlik*
Affiliation:
Institute of Physics, ASCR, Cukrovarnicka 10, Prague 16200, Czech Republic
Daria Miliaieva
Affiliation:
Institute of Physics, ASCR, Cukrovarnicka 10, Prague 16200, Czech Republic Faculty of Electrical Engineering, Czech Technical University, Technicka 2, 16627 Prague 6, Czech Republic
Marian Varga
Affiliation:
Institute of Physics, ASCR, Cukrovarnicka 10, Prague 16200, Czech Republic
Alexander Kromka
Affiliation:
Institute of Physics, ASCR, Cukrovarnicka 10, Prague 16200, Czech Republic
Bohuslav Rezek
Affiliation:
Institute of Physics, ASCR, Cukrovarnicka 10, Prague 16200, Czech Republic Faculty of Electrical Engineering, Czech Technical University, Technicka 2, 16627 Prague 6, Czech Republic
*
*(Email: stehlik@fzu.cz)
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Abstract

Nanodiamonds (NDs) represent a novel nanomaterial applicable from biomedicine to spintronics. Here we study ability of air annealing to further decrease the typical 5 nm NDs produced by detonation synthesis. We use atomic force microscopy (AFM) with sub-nm resolution to directly measure individual detonation nanodiamonds (DNDs) on a flat Si substrate. By means of particle analysis we obtain their accurate and statistically relevant size distributions. Using this approach, we characterize evolution of the size distribution as a function of time and annealing temperature: i) at constant time (25 min) with changing temperature (480, 490, 500°C) and ii) at constant temperature (490°C) with changing time (10, 25, 50 min). We show that the mean size of DNDs can be controllably reduced from 4.5 nm to 1.8 nm without noticeable particle loss and down to 1.3 nm with 36% yield. By air annealing the size distribution changes from Gaussian to lognormal with a steep edge around 1 nm, indicating instability of DNDs below 1 nm.

Keywords

diamondannealingscanning probe microscopy (SPM)
Type
Articles
Information
MRS Advances , Volume 1 , Issue 16: Electronics and Photonics , 2016 , pp. 1067 - 1073
Copyright
Copyright © Materials Research Society 2016 

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