Annular Dark-Field Scanning Transmission Electron Microscopy Captures Sb-Related Clusters in Silicon

Christopher Matranga

doi:10.1557/mrs2002.163

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Annular Dark-Field Scanning Transmission Electron Microscopy Captures Sb-Related Clusters in Silicon

Published online by Cambridge University Press: 31 January 2011

Christopher Matranga

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Type: Research/Researchers
Information: MRS Bulletin , Volume 27 , Issue 7: Vertical-Cavity Surface-Emitting Lasers , July 2002 , pp. 494

DOI: https://doi.org/10.1557/mrs2002.163 [Opens in a new window]
Copyright: Copyright © Materials Research Society 2002

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Annular Dark-Field Scanning Transmission Electron Microscopy Captures Sb-Related Clusters in Silicon

Volume 27, Issue 7
Christopher Matranga
DOI: https://doi.org/10.1557/mrs2002.163

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Annular Dark-Field Scanning Transmission Electron Microscopy Captures Sb-Related Clusters in Silicon

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