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Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces

Published online by Cambridge University Press:  31 January 2011

John F. Ankner  and
Hartmut Zabel
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Abstract

Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science.

Keywords

nanoscaleneutron reflectivityneutron scatteringthin films
Type
Research Article
Information
MRS Bulletin , Volume 28 , Issue 12: New Frontiers in the Application of Neutron Scattering to Materials Research , December 2003 , pp. 918 - 922
Copyright
Copyright © Materials Research Society 2003

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