Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-28T15:23:11.030Z Has data issue: false hasContentIssue false
  • English
  • Français

Biaxially Textured IBAD-MgO Templates for YBCO-Coated Conductors

Published online by Cambridge University Press:  31 January 2011

Paul N. Arendt  and
Stephen R. Foltyn
Get access

Abstract

This article reports on the development of second-generation Y1Ba2Cu3O7–(YBCO)-coated conductors deposited on biaxially textured MgO templates fabricated using ion-beam-assisted deposition (IBAD).The materials system architecture and processing techniques used to achieve high critical supercurrents on flexible superalloy substrates is described.The texturing of YBCO films on metal substrates approaches that of films deposited on single-crystal oxide substrates.Critical currents and critical current densities of YBCO films on metal substrates are also equivalent to YBCO films deposited on single-crystal oxides.

Keywords

biaxially textured MgO templateshigh-temperature superconductorsIBADion-beam-assisted depositionYBCO
Type
Research Article
Information
MRS Bulletin , Volume 29 , Issue 8: High-Performance YBCO-Coated Superconductor Wires , August 2004 , pp. 543 - 550
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Nelson, R.S. and Thompson, M.W.Phil. Mag. 8 (1963) p.1677.Google Scholar
2Andreen, C.J. and Hines, R.L.Phys. Rev. 151 (1966) p.341.Google Scholar
3Piercy, G.R.Brown, F.Davies, J.A. and McCargo, M.Phys. Rev. Lett. 10 (1963) p.399.Google Scholar
4Robinson, M.T. and Oen, O.S.Appl. Phys. Lett. 2 (1963) p.30.CrossRefGoogle Scholar
5Robinson, M.T. and Oen, O.S.Phys. Rev. 132 (1963) p.2385.Google Scholar
6Magnuson, G.D. and Carlson, C.E.J. Appl. Phys. 34 (1963) p.3267.CrossRefGoogle Scholar
7Trillat, J.J.Terao, N.Tertain, L. and Gervais, H.J.Phys. Soc. Jpn. 4 (1956) p.406.CrossRefGoogle Scholar
8Dobrev, D. and Marinov, M.C.R. Acad. Bulg. Sci. 26 (1973) p.231.Google Scholar
9Dobre, D. and Marinov, M.Bulg. Acad. Sci. Commun. Dept. Chem. 8 (1975) p.334.Google Scholar
10van Wyk, G.N. and Smith, H.J.Rad. Eff. 38 (1978) p.245.Google Scholar
11Marinov, M. and Dobrev, D.Thin Solid Films 42 (1977) p.265.CrossRefGoogle Scholar
12Atrei, A.Roveda, G.Torrini, M.Bardi, U.Gleeson, M. and Barnes, C.J.Surf. Sci. 372 (1997) p.91.CrossRefGoogle Scholar
13Wyk, G.N. van and Smith, H.J.Rad. Eff. 170 (1980) p.433.Google Scholar
14Kung, K.T.Y.Iverson, R.B. and Reif, R.Nucl. Inst. & Meth. 46 (1985) p.683.Google Scholar
15Dobrev, D.Thin Solid Films 92 (1982) p. 41.CrossRefGoogle Scholar
16Yu, L.S.Harper, J.M.E.Cuomo, J.J. and Smith, D.A.Appl. Phys. Lett. 47 (1985) p.932.Google Scholar
17Yu, L.S.Harper, J.M.E.Cuomo, J.J. and Smith, D A.J.Vac. Sci. Tech. A 4 (1986) p.443.CrossRefGoogle Scholar
18Bradley, R.M.Harper, J.M.E.Cuomo, J.J. and Smith, D.A.J. Appl. Phys. 60 (1986) p. 4160.CrossRefGoogle Scholar
19Witanachchi, S.Patel, S.Zhu, Y.Z.Kwok, H.S. and Shaw, D.T.J. Mater. Res. 5 (1990) p.717.CrossRefGoogle Scholar
20Russo, R.E.Reade, R.P.McMillian, J.M. and Olsen, B.L.J.Appl. Phys. 68 (1990) p.1354.CrossRefGoogle Scholar
21Kumar, A.Ganapathi, L.Kanetkar, S.M. and Narayan, J., Appl. Phys. Lett. 57 (1990) p.2594.CrossRefGoogle Scholar
22Narumi, E.Song, L.W.Yang, F.Patel, S.Kao, Y.H. and Shaw, D.T.Appl. Phys. Lett. 58 (1991) p.1202.CrossRefGoogle Scholar
23Reade, R.P.Mao, X.L. and Russo, R.E.Appl. Phys. Lett. 59 (1991) p.739.CrossRefGoogle Scholar
24Fork, D.K.Fenner, D.B.Barton, R.W.Phillips, J.M.Connel, G.A.N.Boyce, J.B. and Geballe, T.H.Appl. Phys. Lett. 57 (1990) p.1161.CrossRefGoogle Scholar
25Jia, Q.X. and Anderson, W.A.Appl. Phys. Lett. 57 (1990) p.304.Google Scholar
26Tiwari, P.Kanetkar, S.M.Sharan, S. and Narayan, J., Appl. Phys. Lett. 57 (1990) p.1578.CrossRefGoogle Scholar
27Dimos, D.Chaudhari, P.Mannhart, J. and LeGoues, J., Phys. Rev. Lett. 55 (1989) p.2442.Google Scholar
28Kao, A.S. and Gorman, G.L.J.Appl. Phys. 67 (1990) p.3826.CrossRefGoogle Scholar
29Iijima, Y.Tanabe, N.Ikeno, Y. and Kohno, O.Physica C 185 (1991) p.1959.CrossRefGoogle Scholar
30Wu, X.D.Foltyn, S.R.Arendt, P.N.Blumenthal, W.R.Campbell, I.H.Cotton, J.D.Coulter, J.Y.Maley, M.P.Safar, H.F. and Smith, J.L.Appl. Phys. Lett. 67 (1995) p.2397.CrossRefGoogle Scholar
31Iijima, Y.Kakimoto, K.Kimura, M.Takeda, K. and Saitoh, T.IEEE Trans. Appl. Super-cond. 11 (2001) p.2816.Google Scholar
32Reade, R.P.Berdahl, P.Russo, R.E. and Garrison, S.M.Appl. Phys. Lett. 61 (1992) p.2231.CrossRefGoogle Scholar
33Reade, R.P. and Russo, R.E.Appl. Surf. Sci. 96 (1996) p.726.CrossRefGoogle Scholar
34Foltyn, S.R.Arendt, P.N.DePaula, R.F.Dowden, P.C.Coulter, J.Y.Groves, J.R.Haussamen, L.N.Winston, L.P.Jia, Q.X. and Maley, M.P.Physica C 341–348 (2000) p.2305.CrossRefGoogle Scholar
35Usoskin, A.Freyhardt, H.C.Issaev, A.Dzick, J.Knoke, J.Oomen, M.P.Leghissa, M. and Neumueller, H.W.IEEE Trans. Appl. Super-cond. 13 (1997) p.2452.CrossRefGoogle Scholar
36Ma, B.Li, M.Fisher, B.L.Koritala, R.E. and Balachandran, U.AIP Conf. Proc. 614 (2002) p.573.CrossRefGoogle Scholar
37Harshavardhan, K.S.Christen, H.M.Silliman, S.D.Talanov, V.V.Anlage, S.M.Rajeswari, M. and Claassen, J.Appl. Phys. Lett. 78 (2001) p.1888.CrossRefGoogle Scholar
38Saavides, N.Thorley, A.Gnanarajan, S.Herrmann, J.Katsaros, A. and Molodyk, A.Physica C 341 (2001) p.2491.Google Scholar
39Gnanarajan, S. and Saavides, N.Thin Solid Films 350 (1999) p.124.CrossRefGoogle Scholar
40Knierim, A.Auer, R. J.Geerk, Li, Y.Linker, G.Meyer, O. J.Reiner, Schweiss, P. and Smithey, R.Nucl. Inst. Meth. Phys. Res. B 127 (1997) p. 832.CrossRefGoogle Scholar
41Wang, J.Fromknecht, R. and Linker, G.J.Vac. Sci. Technol. A 21 (2003) p.62.CrossRefGoogle Scholar
42Mu, H.Ren, C.Jiang, B.Yu, Y.Luo, E.Z. and Wilson, Z.H.Surf. Coat. Technol. 124 (2000) p.61.CrossRefGoogle Scholar
43Mao, Y.J.Liu, X.H.Zhang, F.Ren, C.X. and Zou, S.C.Surf. Coat. Technol. 104 (1998) p.78.CrossRefGoogle Scholar
44Holzapfel, B.Betz, V.Arranz, M.A.Reger, N. and Schultz, L. (Mater. Res. Soc. Symp. Proc. 526, Warrendale, PA, 1998) p.257.Google Scholar
45Ressler, K.G.Sonnenberg, N. and Cima, M.J.J.Amer. Ceram. Soc. 80 (1997) p.2637.CrossRefGoogle Scholar
46Zhu, S.Lowndes, D.H.Budai, J.D. and Norton, D.P.Appl. Phys. Lett. 65 (1994) p.2012.CrossRefGoogle Scholar
47Xiong, X. and Winkler, D.Physica C 336 (2000) p.70.Google Scholar
48Iijima, Y.Kakimoto, K. and Takeda, K.IEEE Trans. Appl. Supercond. 11 (2001) p.3451.Google Scholar
49Iijima, Y.Kakimoto, K.Takeda, K. and Saitoh, T.Proc. Int. Workshop on Superconductivity, Honolulu, HI (2001) p.47.Google Scholar
50Selvamanickam, V. in Proc. of the Department of Energy Superconductivity for Electrical Systems Annual Peer Review [CD-ROM] (2003).Google Scholar
51Thiele, K.Sievers, S.Jooss, C.Hoffmann, J. and Freyhardt, H.C.J. Mater. Res. 18 (2003) p.442.CrossRefGoogle Scholar
52Wang, C.P.Do, K.B.Beasley, M.R.Geballe, T.H. and Hammond, R.H.Appl. Phys. Lett. 71 (1997) p.2955.CrossRefGoogle Scholar
53Kreiskott, S.Coulter, J.Y.Gibbons, B.J. and Matias, V.presented at Symposium EE, Materials Research Society Meeting, Boston, December 2003.Google Scholar
54Gibbons, B.J.Kreiskott, S.Matias, V.Holesinger, T.G. and Coulter, J.Y.presented at Symposium EE, Materials Research Society Meeting, Boston, December 2003.Google Scholar
55Arendt, P.N.Foltyn, S.R.Civale, L.DePaula, R.F.Dowden, P.C.Groves, J.R.Holesinger, T.G.Jia, Q.X.Kreiskott, S.Stan, L.Usov, I.Wang, H. and Coulter, J.Y. Physica C (2004) in press.Google Scholar
56Brewer, R.T. and Atwater, H.A.Appl. Phys. Lett. 80 (2002) p.3388.Google Scholar
57Huhne, R.Beyer, C.Holzapfel, B.Oertel, C.-G.Schultz, L. and Skrotzki, W.Cryst. Res. Technol. 35 (2000) p.419.Google Scholar
58Dzick, J.Hoffmann, J.Sievers, S.Kautschor, L.O. and Freyhardt, H.C.Phys. C 372–376 (2002) p.723.CrossRefGoogle Scholar
59Groves, J.R.Arendt, P.N.Foltyn, S.R.DePaula, R.F.Peterson, E.J.Holesinger, T.G.Coulter, J.Y. and Springer, R.W.IEEE Trans. Appl. Supercond. 9 (1999) p.1964.Google Scholar
60Lee, J.S.Ryu, B.G.Kwon, H.J.Jeong, Y.W. and Kim, H.H.Thin Solid Films 354 (1999) p.82.Google Scholar
61Aboelfot, M.O.Appl. Phys. Lett. 24 (1974) p.347.Google Scholar
62Zepeda-Ruiz, L.A. and Srolovitz, D.J.J.Appl. Phys. 91 (2002) p.10169.Google Scholar
63Arendt, P.Foltyn, S.Jia, Q.X.Groves, R.Holesinger, T.Matias, V.Emmert, L.DePaula, R.Stan, L.Findikoglu, A.Kreiskott, S. and Li, Y.presented at Symposium S, Materials Research Society Meeting, Boston, December 2002.Google Scholar
64Weismann, J.Dzick, J.Hoffmann, J.Heinemann, K. and Freyhardt, H.C.J. Mater. Res. 13 (1998) p.3149.CrossRefGoogle Scholar
65Groves, J.R.Arendt, P.N.Foltyn, S.R.Jia, Q.X.Holesinger, T.G.Emmert, L.A.DePaula, R.F. P.C Dowden, and Stan, L.IEEE Trans. Appl. Supercond. 13 (2003) p.2651.CrossRefGoogle Scholar
66Kreiskott, S.Arendt, P.N.Bronisz, L.E.Foltyn, S.R. and Matias, V.Supercond. Sci. Technol. 16 (2003) p.613.Google Scholar
67Wang, C.P. “Ion-beam induced texturing in oxide thin films and its applications,” PhD dissertation, Stanford University, 1999.Google Scholar
68Li, X.Rupich, M.W.Zhang, W.Nguyen, N.Kodenkandath, T.Schoop, U.Verebelyi, D.T.Thieme, C.Jowett, M.Arendt, P.N.Foltyn, S.R.Holesinger, T.G.Aytug, T.Christen, D.K. and Paranthaman, M.P.Physica C 390 (2003) p. 249.Google Scholar
69Usov, I.Arendt, P.Stan, L.DePaula, R.Wang, H.Foltyn, S. and Dowden, P.J. Mater. Res. 19 (2004) p.1175.Google Scholar
70Gupta, A.Wang, H.Kvit, A.Duscher, G. and Narayan, J.J. Appl. Phys. 93 (2003) p. 5210.CrossRefGoogle Scholar
71Kingery, W.D.Bowen, H.K. and Uhlmann, D.R.Introduction to Ceramics, 2nd ed. (John Wiley & Sons, New York, 1976).Google Scholar
72Holesinger, T.G.Foltyn, S.R.Arendt, P.N.Jia, Q.X.Dowden, P.C.DePaula, R.F. and Groves, J.R.IEEE Trans. Appl. Supercond. 11 (2001) p.3359.CrossRefGoogle Scholar
73Paranthaman, M.Aytug, T.Christen, D.K.Arendt, P.N.Foltyn, S.R.Groves, J.R.Stan, L.DePaula, R.F.Wang, H. and Holesinger, T.G.J.Mater. Res. 18 (2003) p.2055.Google Scholar
74Li, X.Rupich, M.W.Zhang, W.Nguyen, N.Kodenkandath, T.Schoop, U.Verebelyi, D.T.Thieme, C.Jowett, M.Arendt, P.N.Foltyn, S.R.Holesinger, T.G.Aytug, T.Christen, D.K. and Paranthaman, M.P.Physica C 390 (2003) p. 249.Google Scholar
75Jia, Q.X.Foltyn, S.R.Arendt, P.N.Groves, J.R.Holesinger, T.G.Hawley, M.E. and Lu, P.Appl. Phys. Lett. 81 (2002) p.4571.Google Scholar
76Wang, H.Foltyn, S.R.Arendt, P.N.Jia, Q.X. J.L. MacManus-Driscoll, Stan, L.Li, Y.Zhang, X. and Dowden, P.C.J. Mater. Res. 19 (2004) p.1869.Google Scholar
77Arendt, P.N. in Proc. of the Department of Energy Superconductivity for Electrical Systems Annual Peer Review [CD-ROM] (2001).Google Scholar
78Iijima, Y.Tanabe, N.Kohno, O. and Ikeno, Y.Appl. Phys. Lett. 60 (1992) p.769.CrossRefGoogle Scholar
79Reade, R.P.Berdahl, P.Russo, R.E. and Garrison, S.M.Appl. Phys. Lett. 61 (1992) p.2231.Google Scholar
80Sonnenberg, N.Longo, A.S.Cima, M.J.Chang, B.P.Ressler, K.G.McIntyre, P.C. and Liu, Y.P.J.Appl. Phys. 74 (1993) p.1027.CrossRefGoogle Scholar
81Wu, X.D.Foltyn, S.R.Arendt, P.Townsend, J., Adams, C.Campbell, I.H.Tiwari, P.Coulter, Y. and Peterson, D.E.Appl. Phys. Lett. 65 (1994) p.1961.CrossRefGoogle Scholar
82Hosaka, M.Iijima, Y.Sadakata, N.Saitoh, T.Kohno, O. and Yoshitomi, J.Adv. Supercond. X edited by Nakajima, S. and Murikami, M. (Springer-Verlag, Tokyo, 1997) p.749.Google Scholar
83Arendt, P.N.Groves, J.R.Foltyn, S.R.Jia, Q.X.Peterson, E.J.DePaula, R.F.Dowden, P.C.Coulter, J.Y. and Ma, M. (Mater. Res. Soc. Symp. Proc. 585, Warrendale, PA, 1999) p.67.Google Scholar
84Foltyn, S.R.Arendt, P.N.DePaula, R.F.Dowden, P.C.Coulter, J.Y.Groves, J.R.Haussamen, L.N.Winston, L.P.Jia, Q.X. and Maley, M.P.Physica C 341–348 (2000) p.2305.Google Scholar
85Iijima, Y.Kakimoto, K.Kimura, M.Takeda, K. and Saitoh, T.IEEE Trans. Appl. Super-cond. 11 (2001) p.2816.Google Scholar
86Dzick, J.Hoffmann, J.Sievers, S.Kautschor, L.O. and Freyhardt, H.C.Physica C 372 (2002) p.723.CrossRefGoogle Scholar
87Kaufman, H.R. and Robinson, R.S.Operation of Broad-Beam Sources (Commonwealth Scientific Corporation, Alexandria, VA, 1987).Google Scholar
88Kahn, J.R.Kaufman, H.R.Phillips, C.A. and Robinson, R.S.J. Vac. Sci. Technol. A 14 (1996) p.2106.Google Scholar
89Foltyn, S.R.Jia, Q.X.Arendt, P.N.Kinder, L.Fan, Y. and Smith, J.F.Appl. Phys. Lett. 75 (1999) p.3692.Google Scholar
90Foltyn, S.R. in Proc. of the Department of Energy Superconductivity for Electrical Systems Annual Peer Review [CD-ROM] (2002).Google Scholar
91Jia, Q.X.Foltyn, S.R.Arendt, P.N. and Smith, J.F.Appl. Phys. Lett. 80 (2002) p.1601.Google Scholar
92Foltyn, S.R.Arendt, P.N.Jia, Q.X.Wang, H. J.MacManus-Driscoll, L., Kreiskott, S.DePaula, R.F.Stan, L.Groves, J.R. and Dowden, P.C.Appl. Phys. Lett. 82 (2003) p.4519.CrossRefGoogle Scholar
93Heinig, N.F.Redwing, R.D.Nordman, J.E. and Larbalestier, D.C.Phys. Rev. B 60 (1999) p.1409.CrossRefGoogle Scholar
94Verebelyi, D.T.Christen, D.K.Feenstra, R.Cantoni, C.Goyal, A.Lee, D.F.Paranthaman, M.Arendt, P.N.DePaula, R.F.Groves, J.R. and Prouteau, C.Appl. Phys. Lett. 76 (2000) p.1755.Google Scholar
95Foltyn, S.R. in Proc. of the Department of Energy Superconductivity for Electrical Systems Annual Peer Review [CD-ROM] (2003).Google Scholar