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Importance of Pico-Scale Topography of Surfaces for Adhesion, Friction, and Failure

Published online by Cambridge University Press:  31 January 2011

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Abstract

This article is an edited transcript based on the MRS Medal Award presentation given by Jacob N. Israelachvili on December 1, 2004, at the Materials Research Society Fall Meeting in Boston. An expanded article on this topic will be published in the August 2005 issue of the Journal of Materials Research. Recent experimental results have shown how surface texture, surface energy, and the bulk properties of materials can affect their adhesion and friction and, in turn, determine some of the fundamental differences between modes of failure of materials. Theoretical modeling and computer simulations, among other methods, provide examples and comparisons of surfaces that are rough or smooth, hard or soft (for example, viscoelastic), adhesive or non-adhesive, and dry (unlubricated) or lubricated. Such studies clarify the molecular and atomic basis of many well-established adhesion and tribological laws and empirical observations, revealing insights and relationships between nanoscale (molecular) and macroscale processes. Also of critical importance are the effects that occur at the sub-nanoscale, that is, in the sub-angstrom or picoscale regime. It is demonstrated and argued that the ultrafine picoscale details of a surface lattice, or its roughness, can be the most important factor in determining its friction (and mode II fracture), whereas such effects are quantitatively less important for adhesion and mode I fracture processes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

1.Thompson, P.A. and Robbins, M.O., Science 250 (1990) p. 792.CrossRefGoogle Scholar
2.He, G., Muser, M.H., and Robbins, M.O., Science 284 (1999) p. 1650.CrossRefGoogle Scholar
3.Luan, B. and Robbins, M.O., Nature 435 (2005) p. 929.CrossRefGoogle Scholar
4.Landman, U., Luedtke, W.D., and Gao, J.P., Langmuir 12 (1996) p. 4514.CrossRefGoogle Scholar
5.Bhushan, B., Israelachvili, J.N., and Landman, U., Nature 374 (1995) p. 607.CrossRefGoogle Scholar
6.Persson, B.N.J. and Tosatti, E., J. Chem. Phys. 115 (2001) p. 5597.CrossRefGoogle Scholar
7.Urbakh, M., Klafter, J., Gourdon, D., and Israelachvili, J., Nature 430 (2004) p. 525.CrossRefGoogle ScholarPubMed
8.Israelachvili, J.N., Intermolecular and Surface Forces, 2nd Ed. (Academic Press, London, 1991).Google Scholar
9.Israelachvili, J.N. and Adams, G.E., J. Chem. Soc. Faraday Trans. 74 (1978) p. 975.CrossRefGoogle Scholar
10.Binnig, G., Quate, C.F., and Gerber, C., Phys. Rev. Lett. 56 (1986) p. 930.CrossRefGoogle Scholar
11.Mangipudi, V., Tirrell, M., and Pocius, A.V., Langmuir 11 (1995) p. 19.CrossRefGoogle Scholar
12.Israelachvili, J.N., J. Colloid Interf. Sci. 44 (1973) p. 259.CrossRefGoogle Scholar
13.Ruths, M., Berman, A., and Israelachvili, J., in Handbook of Nanotechnology (Springer-Verlag, Berlin, 2003) p. 543.Google Scholar
14.Greenwood, J.A. and Williamson, J.B.P., Proc. R. Soc. London, Ser. A 295 (1966) p. 300.Google Scholar
15.Ruths, M., Alcantar, N.A., and Israelachvili, J.N., J. Phys. Chem. B 107 (2003) p. 11149.CrossRefGoogle Scholar
16.Gao, J.P., Luedtke, W.D., Gourdon, D., Ruths, M., Israelachvili, J.N., and Landman, U., J. Phys. Chem. B 108 (2004) p. 3410.CrossRefGoogle Scholar
17.Johnson, K.L., Contact Mechanics (Cambridge University Press, Cambridge, U.K., 1985).CrossRefGoogle Scholar
18.Gee, M.L., McGuiggan, P.M., Israelachvili, J.N., and Homola, A.M., J. Chem. Phys. 93 (1990) p. 1895.CrossRefGoogle Scholar
19.Israelachvili, J., Gee, M., McGuiggan, P., Thompson, P., and Robbins, M., in Dynamics in Small Confining Systems, edited by Drake, J.M., Klafter, J., and Kopelman, R. (Mater. Res. Soc. Symp. Extended Abstracts EA–22, Pittsburgh, PA, 1990) p. 3.Google Scholar
20.Yoshizawa, H., PhD thesis, University of California, Santa Barbara (1993).Google Scholar
21.Berman, A., PhD thesis, University of California, Santa Barbara (1996).Google Scholar
22.Zhu, Y. and Granick, S., Langmuir 19 (2003) p. 8148.CrossRefGoogle Scholar
23.Drummond, C. and Israelachvili, J., Macromolecules 33 (2000) p. 4910.CrossRefGoogle Scholar
24.Drummond, C. and Israelachvili, J., Phys. Rev. E 63 041506(2001).CrossRefGoogle Scholar