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Nanoscale impedance and complex properties in energy-related systems

Published online by Cambridge University Press:  12 July 2012

Wonyoung Lee ,
Fritz B. Prinz ,
Xi Chen ,
S. Nonnenmann ,
Dawn A. Bonnell  and
Ryan P. O’Hayre
Wonyoung Lee
Affiliation:
Nuclear Science and Engineering Department, Massachusetts Institute of Technology; leewy@mit.edu
Fritz B. Prinz
Affiliation:
Mechanical Engineering and Materials Science and Engineering Departments, Stanford University; fbp@cdr.stanford.edu
Xi Chen
Affiliation:
Materials Science and Engineering, University of Pennsylvania; xich@seas.upenn.edu
S. Nonnenmann
Affiliation:
Materials Science and Engineering, University of Pennsylvania; ssn@seas.upenn.edu
Dawn A. Bonnell
Affiliation:
Materials Science and Engineering, University of Pennsylvania; bonnell@lrsm.upenn.edu
Ryan P. O’Hayre
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines; rohayre@mines.edu
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Abstract

Atomic force microscopy (AFM)-based impedance spectroscopy provides localized impedance information of materials and interfaces at the nanoscale by utilizing the conductive AFM tip as a moving electrode to detect current response as a function of time and frequency under controlled environments. This capability enables AFM-based nanoscale impedance measurements to play a unique role in enhancing our understanding of many electronic and electrochemical devices. This article introduces the central concepts of AFM-based impedance measurement and reviews recent examples applying this technique to a variety of functional materials systems, in particular focusing on fuel cells, lithium-ion batteries, photoactive biomembranes, as well as other application examples.

Keywords

scanning probe microscopyionic conductorsurface chemistryelectrical propertiesenergy generationenergy storage
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 7: Scanning probes for new energy materials: Probing local structure and function , July 2012 , pp. 659 - 667
Copyright
Copyright © Materials Research Society 2012

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