Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-15T02:41:56.148Z Has data issue: false hasContentIssue false

Prospects for Molecular-Scale Electronics

Published online by Cambridge University Press:  31 January 2011

Get access

Extract

Scientific consideration of how to scale electronics down to the molecular level started in the mid-1970s. Unfortunately, at the time, researchers did not have the adequate analytical tools to perform the experiments. That has changed drastically, and therefore interest in this field has been renewed, especially over the last few years.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Landauer, R., IBM J. Res. Dev. 1 (1957) p. 223.CrossRefGoogle Scholar
2.van Wees, B.J., van Houten, H., Beenakker, C.W. J., Williamson, J.G., Kouwenhoven, L.P., van der Marel, D., and Foxon, C.T., Phys. Rev. Lett. 60 (1988) p. 848; B.J. van Wees, H. van Houten, C.W.J. Beenakker, J.G. Williamson, L.P. Kouwenhoven, D. van der Marel, and C.T. Foxon, Phys. Rev. B 43 (1991) p. 12431.CrossRefGoogle Scholar
3.Wharam, D.A., Thornton, T.J., Newbury, R., Pepper, M., Ahmed, H., Frost, J.E.F., Hasko, D.G., Peacock, D.C., Ritchie, D.A., and Jones, G.A.C., J. Phys. C 21 (1988) p. L209.CrossRefGoogle Scholar
4.Muller, C.J., Krans, J.M., Todorov, T.N., and Reed, M. A., Phys. Rev. B 53 (1996) p. 1022.CrossRefGoogle Scholar
5.Deshpande, M.R., Sleight, J.W., Reed, M.A., Wheeler, R.G., and Matyi, R.J., Phys. Rev Lett. 76 (1996) p. 1328.CrossRefGoogle Scholar
6.Bumm, L.A., Arnold, J.J., Cygan, M.T., Dunbar, T.D., Burgin, T.P., IIJones, L., Allara, D.L., Tour, J.M., and Weiss, P.S., Science 271 (1996) p. 1705.CrossRefGoogle Scholar
7.Chen, J., Reed, M.A., Asplund, C.L., Cassell, A.M., Rawlett, A.M., Tour, J.M., and Van Patten, P.G., Appl. Phys. Lett. 75 (1999) p. 624.CrossRefGoogle Scholar
8.Reed, M.A., Zhou, C., Muller, C.J., Burgin, T.P., and Tour, J.M., Science 278 (1997) p. 252.CrossRefGoogle Scholar
9.Zhou, C., Deshpande, M.R., Reed, M.A., and Tour, J.M., Applied Phys. Lett. 71 (1997) p. 611.CrossRefGoogle Scholar
10.Aviram, A. and Ratner, M.A., Chem. Phys. Lett, 29 (1974) p. 277; R.M. Metzger, B. Chen, U. Höpfner, M.V. Lakshmikantham, D. Vuillaume, T. Kawai, X. Wu, H. Tachibana, T. Hughes, H. Sakurai, J.W. Baldwin, C. Hosch, M.P. Cava, L. Brehmer, and G.J. Ashwell, J. Am. Chem. Soc. 119 (1997) p. 10455.CrossRefGoogle Scholar
11.Chen, J., Calvet, L.C., Reed, M.A., Carr, D.W., Grubisha, D.S., and Bennett, D.W., Chem Phys. Lett. 313 (1999) p. 741.CrossRefGoogle Scholar
12.Chen, J., Wang, W., Reed, M.A., Rawlett, M., Price, D.W., and Tour, J.M., “Room-Temperature Negative Differential Resistance in Nanoscale Molecular Junctions,” Appl. Phys. Lett. 22 (2000) p. 1224.CrossRefGoogle Scholar