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Scanning transmission electron microscopy: Seeing the atoms more clearly

Published online by Cambridge University Press:  09 October 2012

Stephen J. Pennycook
Stephen J. Pennycook*
Affiliation:
Materials Science and Technology Division at Oak Ridge National Laboratory; pennycooksj@ornl.gov
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Abstract

This article shows how the scanning transmission electron microscope provides a Z-contrast image (where Z is atomic number) that is often directly interpretable and can show higher resolution than a phase-contrast image. It represents an incoherent mode of imaging, similar to that described by Lord Rayleigh for the optical microscope over a century ago. Today, resolution has reached a half Ångstrom, and spectroscopic analysis of individual atomic columns, even of individual atoms in two-dimensional materials, has become possible.

Keywords

Scanning transmission electron microscopy (STEM)electron energy loss spectroscopy (EELS)atomic arrangementschemical compositiondefects
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 10: Thermal-barrier coatings for more efficient gas-turbine engines , October 2012 , pp. 943 - 951
Copyright
Copyright © Materials Research Society 2012

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