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Single atom imaging and spectroscopy in nanostructured carbon materials

Published online by Cambridge University Press:  13 January 2012

Kazu Suenaga ,
Haruka Kobayashi  and
Masanori Koshino
Kazu Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; suenaga-kazu@aist.go.jp
Haruka Kobayashi
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; haruka-kobayashi@aist.go.jp
Masanori Koshino
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; m-koshino@aist.go.jp
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Abstract

Identifying constituent atoms in materials is the ultimate goal for all analytical techniques. Here, we describe the successful achievement of single atom spectroscopy in nanostructured carbon-based materials using a scanning transmission electron microscope equipped with electron energy-loss spectroscopy. The chemical analyis of individual metallofullerene molecules can be successfully performed without massive beam damage. Atom-by-atom spectroscopy of the edge carbon atoms in single layer graphene is also discussed.

Keywords

Nanoscaleelectron energy-loss spectroscopy (EELS)scanning transmission electron microscopy (STEM)defects
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 1: Spectroscopic imaging in electron microscopy , January 2012 , pp. 36 - 38
Copyright
Copyright © Materials Research Society 2012

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