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Automated self-assembly and electrical characterization of nanostructured films

Published online by Cambridge University Press:  02 April 2018

Rafael C. Hensel ,
Kevin L. Rodrigues ,
Vinicius do L. Pimentel ,
Antonio Riul Jr.  and
Varlei Rodrigues
Rafael C. Hensel
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
Kevin L. Rodrigues
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
Vinicius do L. Pimentel
Affiliation:
Information Technology Center Renato Archer, 13069-901, Campinas, SP, Brazil
Antonio Riul Jr.
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
Varlei Rodrigues*
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
*
Address all correspondence to Varlei Rodrigues at varlei@ifi.unicamp.br
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Abstract

Significant progress in nanoscience was achieved through the development of methods and instruments to better comprehend nanoscale properties. We present here a methodology and automated setup to measure layer-by-layer films capacitance in the air immediately after polyelectrolytes adsorption. It presents high accuracy (~0.01 pF) to check the capacitance stabilization during spontaneous drying process in the air, with sensitivity to show electrical signal alternation accordingly to the outermost polyelectrolyte layer. Besides, a linear trend in capacitance was observed similar to UV–vis measurements. This method allows analyzing films electrical properties, affording better choice of materials, thickness, and molecular architecture.

Type
Research Letters
Information
MRS Communications , Volume 8 , Issue 2 , June 2018 , pp. 283 - 288
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Copyright
Copyright © Materials Research Society 2018 

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