Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-13T05:41:58.624Z Has data issue: false hasContentIssue false

4K-GM Cryocooler Performance and Thermal Conductivity of HoxEr1-xN

Published online by Cambridge University Press:  29 April 2013

Takanori Nakano
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Yusuke Hirayama
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Takushi Izawa
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Takashi Nakagawa
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Yasushi Fujimoto
Affiliation:
Institute of Laser Engineering, Osaka University, 2-6 Yamadaoka, Suita, Osaka 565-0871, Japan
Shinji Masuyama
Affiliation:
Oshima National College of Maritime Technology, 1091-1 Komatsu, Suo-oshima-cho, Oshima-gun, Yamaguchi 742-2193, Japan.
Toshio Irie
Affiliation:
Santoku Corporation, 4-14-34 Fukaekita-cho, Higashinada-ku, Kobe, Hyogo 658-0013, Japan.
Eiji Nakamura
Affiliation:
Santoku Corporation, 4-14-34 Fukaekita-cho, Higashinada-ku, Kobe, Hyogo 658-0013, Japan.
Takao A. Yamamoto
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Get access

Abstract

HoxEr1-xN (x=0.25, 0.5, 0.75) samples were synthesized by nitriding of HoxEr1-x alloy bars and their thermal conductivity κ were measured. The measured κ values were comparable to those of stainless steel and Er3Ni. Ho0.5Er0.5N showed the highest κ of the present three samples. The thermal diffusivity calculated from the κ and the specific heat indicates that Ho0.5Er0.5N is a very promising regenerator material for the cryocoolers. The electrical resistivity ρ was also measured as a function of temperature.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

deWaele, A.T.A.M., J. Low Temp. Phys. 164, 179236 (2011).CrossRefGoogle Scholar
Nakagawa, T., Sako, K., Arakawa, T., Yamamoto, T.A., J. Alloys and Comp. 364, 5358 (2004).CrossRefGoogle Scholar
Yamamoto, T.A., Nakagawa, T., Sako, K., Arakawa, T., Nitani, H., J. Alloys and Comp. 376, 1722 (2004).CrossRefGoogle Scholar
Nakagawa, T., Sako, K., Arakawa, T., Tomioka, N., Yamamoto, T.A., Kamiya, K., Numazawa, T., J. Alloys and Comp. 408412, 187190 (2006).CrossRefGoogle Scholar
Nakagawa, T., Arakawa, T., Sako, K., Tomioka, N., Yamamoto, T.A., Kusunose, T., Niihara, K., Kamiya, K., Numazawa, T., J. Alloys and Comp. 408412, 191195 (2006).CrossRefGoogle Scholar
Hirayama, Y., Nakagawa, T., Kusunose, T., and Yamamoto, T.A., IEEE Trans. Magn. 44(11), 29973000 (2008).CrossRefGoogle Scholar
Nishio, S., Nakagawa, T., Arakawa, T., Tomioka, N., Yamamoto, T.A., Kusunose, T., Niihara, K., Numazawa, T., Kamiya, K., J. Appl. Phys. 99, 08K901 (2006).CrossRefGoogle Scholar
Hirayama, Y., Tomioka, N., Nishio, S., Kusunose, N., Nakagawa, T., Kamiya, K., Numazawa, T., Yamamoto, T.A., J. Alloys and Comp. 462, L12–L15 (2008).CrossRefGoogle Scholar
Nakano, T., Hirayama, Y., Izawa, T., Nakagawa, T., Yamamoto, T.A., Fujimoto, Y., Masuyama, S., Irie, T., Nakamura, E., Proc. 24th Int. Cryog. Eng. Conf., May1418, 2012, Fukuoka, Japan. (in press)Google Scholar
Nakano, T., Masuyama, S., Hirayama, Y., Izawa, T., Nakagawa, T., Fujimoto, Y., Irie, T., Nakamura, E., Yamamoto, T.A., “ErN and HoN spherical regenerator materials for 4K-GM Cryocooler, ” J. Appl. Phys.. (to be accepted) Google Scholar
Bischof, J., Diviš, M., Svoboda, P., Smetana, Z., Phys. Stat. Sol. (A) Appl. Res. 114, K229–K231 (1989).CrossRefGoogle Scholar
Sahashi, M., Tokai, Y., Kuriyama, T., Nakagome, H., Li, R., Ogawa, M., Hashimoto, T., Adv. Cryog. Eng. 35, 11751182 (1990).Google Scholar
Kuriyama, T., Hakamada, R., Nakagome, H., Tokai, Y., Sahashi, M., Li, R., Yoshida, O., Matsumoto, K., Hashimoto, T., Adv. Cryog. Eng. 35, 12611269 (1990).Google Scholar
Ogawa, M., Li, R., Hashimoto, T., Cryogenics 31, 405410 (1991).CrossRefGoogle Scholar
Wachter, P., Results in Physics 2, 9096 (2012).CrossRefGoogle Scholar