Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-28T05:44:11.680Z Has data issue: false hasContentIssue false
  • English
  • Français

Absorption Saturation and Two-Photon Absorption in Graphene

Published online by Cambridge University Press:  21 August 2014

Weiqiang Chen ,
Yu Wang  and
Wei Ji
Weiqiang Chen
Affiliation:
National University of Singapore, Singapore
Yu Wang
Affiliation:
National University of Singapore, Singapore
Wei Ji*
Affiliation:
National University of Singapore, Singapore
*
#Email Address: phyjiwei@nus.edu.sg
Get access

Abstract

We have investigated the photon-energy dependence of nonlinear optical absorption in graphene in the near infrared (NIR) and visible range (1.13 – 3.1 eV). Two nonlinear processes, namely one-photon interband absorption saturation and two-photon absorption (2PA), have been unambiguously determined in high-quality, CVD-grown, multilayer graphene films with using femtosecond Z-scan technique. The absorption saturation is found to have a square dependence on the photon energy. The 2PA spectrum is measured to be close to the theoretical prediction of ω-4 dependence at NIR wavelengths. In the visible range, however, the photon-energy dependence of 2PA is dominated by the excitonic Fano resonance.

Keywords

chemical vapor deposition (CVD) (deposition)optical propertiesabsorption
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1698: Symposium JJ – Materials, Processes and Devices for Nanophotonics, Nonlinear Optics and Resonant Optics , 2014 , mrss14-1698-jj02-04
Copyright
Copyright © Materials Research Society 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Xing, Guichuan; Hongchen, Guo; Xinhai, Zhang; Tze Chien, Sum; Cheng, Huan Hon Alfred. Opt. Express 18, 4564 (2010).CrossRefGoogle Scholar
Yang, Hongzhi, Feng, Xiaobo, Wang, Qian, Huang, Han, Chen, Wei, Wee, Andrew T. S., and Ji, Wei. Nano Lett. 11, 2622 (2011).CrossRefGoogle Scholar
Winnerl, S, Göttfert, F, Mittendorff, M, Schneider, H, Helm, M, Winzer, T, Malic, E, Knorr, A, Orlita, M, Potemski, M, Sprinkle, M, Berger, C and de Heer, W A. J. Phys.: Condens.Matter 25, 054202 (2013).Google Scholar
Winzer, Torben, Knorr, Andreas, Mittendorff, Martin, Winnerl, Stephan, Lien, Miao-Bin, Sun, Dong, Norris, Theodore B., Helm, Manfred and Malic, Ermin. Appl. Phys. Lett. 101, 221115 (2012).Google Scholar
Sun, Zhipei, Hasan, Tawfique, Torrisi, Felice, Popa, Daniel, Privitera, Giulia, Wang, Fengqiu, Bonaccorso, Francesco, Basko, Denis M. and Ferrari, Andrea C.. ACS Nano 4, 803 (2010).CrossRefGoogle Scholar
Martinez, Amos, Fuse, Kazuyuki and Yamashita, Shinji. Appl. Phys. Lett. 99, 121107 (2011).CrossRefGoogle Scholar
Zhang, Han; Stéphane, Virally; Qiaoliang, Bao; Loh, Kian Ping; Serge, Massar; Nicolas, Godbout; Pascal, Kockaert Opt. Lett. 37, 1856 (2012).CrossRefGoogle Scholar
Vasko, F. T., Phys. Rev. B 82, 245422 (2010).CrossRefGoogle Scholar
Li, Xuesong, Cai, Weiwei, An, Jinho, Kim, Seyoung, Nah, Junghyo, Yang, Dongxing, Piner, Richard, Velamakanni, Aruna, Jung, Inhwa, Tutuc, Emanuel, Banerjee, Sanjay K., Colombo, Luigi, and Ruoff, Rodney S.. Science 324, 1312 (2009).CrossRefGoogle Scholar
Bae, Sukang, Kim, Hyeongkeun,Lee, Youngbin, Xu, Xiangfan, Park, Jae-Sung, Zheng, Yi, Balakrishnan, Jayakumar, Lei, Tian, Kim, Hye Ri, Song, Young Il, Kim, Young-Jin, Kim, Kwang S., Özyilmaz, Barbaros, Ahn, Jong-Hyun, Hong, Byung Hee & Iijima, Sumio Nat. Nanotechnol 5, 574 (2010).CrossRefGoogle Scholar
Hendry, E., Hale, P. J., Moger, J., Savchenko, A. K., and Mikhailov, S. A.. Phys. Rev. Lett. 105, 097401 (2010).CrossRefGoogle Scholar
Nair, R. R., Blake, P., Grigorenko, A. N., Novoselov, K. S., Booth, T. J., Stauber, T., Peres, N. M. R., and Geim, A. K.. Science 320, 1308 (2008).CrossRefGoogle Scholar
Mak, Kin Fai, Sfeir, Matthew Y., Wu, Yang, Lui, Chun Hung, Misewich, James A., and Heinz, Tony F.. Phys. Rev. Lett. 101, 196405 (2008).CrossRefGoogle Scholar
Andol, Tsuneya, Zhengl, Yisong, and Suzuura, Hidekatsu. J. Phys. Soc. Jpn. 71, 1318 (2002).CrossRefGoogle Scholar
Peres, N. M. R., Rev. Mod. Phys. 82, 2673 (2010).CrossRefGoogle Scholar
Chae, Dong-Hun, Utikal, Tobias, Weisenburger, Siegfried, Giessen, Harald, Klitzing, Klaus v., Lippitz, Markus, and Smet, Jurgen. Nano Lett. 11, 1379 (2011).CrossRefGoogle Scholar
Mak, Kin Fai, Shan, Jie, and Heinz, Tony F.. Phys. Rev. Lett. 106, 046401 (2011).CrossRefGoogle Scholar