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Applications of Sims to Spatially Modified Polymer Film Characterization

Published online by Cambridge University Press:  22 February 2011

Richard W. Linton ,
Cheryl L. Judy ,
Susan G. Maybury  and
Sean F. Corcoran
Richard W. Linton
Affiliation:
Department of Chemistry, University of North Carolina, Chapel Hill, NC 27599-3290
Cheryl L. Judy
Affiliation:
Department of Chemistry, University of North Carolina, Chapel Hill, NC 27599-3290
Susan G. Maybury
Affiliation:
Department of Chemistry, University of North Carolina, Chapel Hill, NC 27599-3290
Sean F. Corcoran
Affiliation:
Department of Chemistry, University of North Carolina, Chapel Hill, NC 27599-3290
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Abstract

The predominant application of secondary ion mass spectrometry (SIMS) to organic polymeric solids has been the molecular monolayer analysis of thin films in the “static” mode. The primary emphasis in this paper, however, is the evaluation of SIMS for two or three dimensional compositional mapping studie of spatially modified polymer. This often requires the use of the “dynamic” SIMS mode to provide lateral images, depth profiles, or 3-D image depth profiles. Selected applications are presented including SIMS studies of surface derivatized polymers, metal-doped conductive polymer films, and patterned polymeric materials or fibers. One analytical objective is to assess the extent to which compositional information is limited by primary beam damage. The outlook for SIMS instrumentation combining high lateral spatial resolution with minimal primary beam damage to surface molecules is summarized, for example the combination of microfocused liquid metal ion sources and time-of-flight mass spectrometry.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 153: Symposium J – Interfaces Between Polymers, Metals, and Ceramics , 1989 , 123
Copyright
Copyright © Materials Research Society 1989

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