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BaTiO3 Waveguides on MgO Buffered-Sapphire Single Crystals

Published online by Cambridge University Press:  10 February 2011

Judit G. Lisoni ,
M. Siegert ,
C. H. Lei ,
C. L. Jia ,
J. Schubert ,
W. Zander  and
Ch. Buchal
Judit G. Lisoni
Affiliation:
Institut für Schicht- und Ionentechnik, D-52425 Juelich, Germany
M. Siegert
Affiliation:
Institut für Schicht- und Ionentechnik, D-52425 Juelich, Germany
C. H. Lei
Affiliation:
Institut für Festörperforschung, Forschungszentrum Jülich GmbH, D-52425 Juelich, Germany
C. L. Jia
Affiliation:
Institut für Festörperforschung, Forschungszentrum Jülich GmbH, D-52425 Juelich, Germany
J. Schubert
Affiliation:
Institut für Schicht- und Ionentechnik, D-52425 Juelich, Germany
W. Zander
Affiliation:
Institut für Schicht- und Ionentechnik, D-52425 Juelich, Germany
Ch. Buchal
Affiliation:
Institut für Schicht- und Ionentechnik, D-52425 Juelich, Germany
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Abstract

Within our program to develop ferroelectric thin film optical waveguides, we have studied the growth of epitaxial waveguides BaTiO3 on r-plane sapphire substrates with a MgO buffer layer. The films were prepared by pulsed laser deposition (PLD). Their structural properties were studied by X-ray diffraction (XRD), transmission electron microscopy (TEM), Rutherford backscattering (RBS) in random and channeling (RBS-c) configuration and atomic force microscopy (AFM). They displayed good crystalline quality, characterized by an RBS-c minimum yield of about 4–6%, a full width at half maximum (FWHM) of the XRD rocking curve measurement of the BaTiO3(200) reflection of 0.32° and a rms roughness of 1.2 nm in a film of ∼ 1.0 μm thickness. The epitaxial relationship was found to be BaTiO3(100) // MgO(100) // A12O3(1102). The refractive index, the birefringence and the optical losses have been measured.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 597: Symposium PP – Thin Films for Optical Waveguide Devices & Materials … , 1999 , 183
Copyright
Copyright © Materials Research Society 2000

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