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Characterisation of Ultrafine Microstructures Using a Position-Sensitive Atom Probe (POSAP)

Published online by Cambridge University Press:  21 February 2011

Alfred Cerezo ,
Chris R. M. Grovenor ,
Mark G. Hetherington ,
Barbara A. Shollock  and
George D. W. Smith
Alfred Cerezo
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
Chris R. M. Grovenor
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
Mark G. Hetherington
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
Barbara A. Shollock
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
George D. W. Smith
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
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Abstract

A new development in the experimental techniques of atom probe microanalysis is described, which involves the use of a position sensitive detector system. This detector subtends a large solid angle (∼20°) at the specimen, and therefore permits the collection of ions from a substantial fraction of the whole surface area of the emitter. Progressive pulsed field evaporation leads to the construction of a three-dimensional map of the atomic chemistry of the specimen. The new instrument is ideally suited to the investigation of complex, ultrafine microstructures. Applications to the study of age-hardened aluminium alloys and Alnico permanent magnet materials are described.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 132: Symposium G – Multicomponent Ultrafine Microstructures , 1988 , 155
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

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