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Chloride Ion Detection by InN Gated AlGaN/GaN High Electron Mobility Transistors

Published online by Cambridge University Press:  31 January 2011

Byung Hwan Chu
Affiliation:
bchu83@gmail.com
Hon-way Lin
Affiliation:
d937313@oz.nthu.edu.tw, National Tsing-Hua University, Department of Physics, Hsinchu, Taiwan, Province of China
Shangjr Gwo
Affiliation:
shangjr.gwo@scholarone.com, National Tsing-Hua University, Department of Physics, Hsinchu, Taiwan, Province of China
Yu-Lin Wang
Affiliation:
ylw59@ufl.edu
S. J. Pearton
Affiliation:
spear@mse.ufl.edu, Univ.Florida, Materials, Gainesville, Florida, United States
J. W. Johnson
Affiliation:
jjohnson@nitronex.com, Nitronex Corporation, Durham, United States
P Rajagopal
Affiliation:
PRajagopal@nitronex.com, Nitronex Corporation, Durham, United States
J. C. Roberts
Affiliation:
jroberts@nitronex.com, Nitronex Corporation, Durham, United States
E. L. Piner
Affiliation:
epiner@nitronex.com, Nitronex Corporation, Durham, United States
K. J. Linthicum
Affiliation:
klinthicum@nitronex.com, Nitronex Corporation, Durham, United States
Fan Ren
Affiliation:
ren@che.ufl.edu, University of Florida, Chemical Engineering, Gainesville, Florida, United States
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Abstract

Chloride ion concentration can be used as a biomarker for the level of pollen exposure in allergic asthma, chronic cough and airway acidification related to respiratory disease. AlGaN/GaN high electron mobility transistor (HEMT) with an InN thin film in the gate region was used for real time detection of chloride ion detection. The InN thin film provided surface sites for reversible anion coordination. The sensor exhibited significant changes in channel conductance upon exposure to various concentrations of NaCl solutions. The sensor was tested over the range of 100 nM to 100 μM NaCl solutions. The effect of cations on the chloride ion detection was also studied.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

1 Taylor, I. J. and hong, S., J. Lab. Med., 31, 563 (2000).Google Scholar
2 Shekhar, H., Chathapuram, V., Hyun, S. H., Hong, S., Cho, H. J., IEEE, 1, 67 (2003).Google Scholar
3 Clinical Methods; The History, Physical, and Laboratory Examinations, 3rd ed, Walker, H. K., Hall, W. D. and Husrt, J. W., Butterworths (1990).Google Scholar
4 Davidsson, A., Söderström, M., Sjöswärd, K. Naidu, Schmekel, B., Respiration, 74, 184 (2007).Google Scholar
5 Niimi, O., Nguyen, L. T., Usmani, O., Mann, B. and Chung, K. F., Thorax, 59, 608 (2004).Google Scholar
6 Effros, R.M., Hoagland, K.W., Bosbous, M., Castillo, D., Foss, B., Dunning, M., Gare, M., Lin, W., and Sun, F., American J. Resp. & Critical Care Med., 165, 663 (2002).Google Scholar
7 Davidsson, B., Sjöswärd, K. Naidu, Lundman, L., Schmekel, B., Respiration, 72, 529 (2005).Google Scholar
8 Cook, J.M. and Miles, D.L., Inst. Geol. Sci. Rep. 80, 5 (1980).Google Scholar
9 Elsheimer, H.N., Geostand Newsl. 11, 115 (1987).Google Scholar
10 Verma, R. and Parthasarthy, R., J. Radioanal. Nucl. Chem. Lett. 214, 391 (1996).Google Scholar
11 Graule, T., Bohlen, A. von, Broekaert, J.A.C., Grallath, E., Klockenkamper, R. and Tschopel, P. and Telg, G., Fresenius Z. Anal. Chem. 335, 637 (1989).Google Scholar
12 Kumar, S.D., Venkatesh, K. and Maiti, B., Chromatograpia 59, 243 (2004).Google Scholar
13 Blackwell, P.A., Cave, M.R., Davis, A.E. and Malik, S.A., J. Chromatogr. A 770 (1997), p. 93.Google Scholar
14 Lu, H., Schaff, W. J., Eastman, L. F., and Stutz, C. E., Appl. Phys. Lett., 82, 1736 (2003).Google Scholar
15 Rickert, K. A., Ellis, A. B., Himpsel, F. J., Lu, H., Schaff, W., Redwing, J. M., Dwikusuma, F., and Kuech, T. F., Appl. Phys. Lett., 82, 3254 (2003).Google Scholar
16 Mahboob, I., Veal, T. D., McConville, C. F., Lu, H., and Schaff, W. J., Phys. Rev. Lett., 92, 036804 (2004).Google Scholar
17 Lu, Y.-S., Ho, C.-L., Yeh, J. A., Lin, H.-W., and Gwo, S., Appl. Phys. Lett. 92, 212102 (2008).Google Scholar
18 Chertow, G. M., Levy, E. M., Hammermeister, K. E., Grover, F., Daley, J., Amer. J. Med., 104, 343 (1998).Google Scholar
19 Wang, H.-T., Kang, B. S., Ren, F., Fitch, R. C., Gillespie, J. K., Moser, N., Jessen, G., Jenkins, T., Dettmer, R., Via, D., Crespo, A., Gila, B. P., Abernathy, C. R., and Pearton, S. J., Appl. Phys. Lett., 87, 172105–1 (2005).Google Scholar
20 Kang, B. S., Wang, H.T., Ren, F., Gila, B. P., Abernathy, C. R., Pearton, S. J., Johnson, J. W., Rajagopal, P., Roberts, J. C., Piner, E. L., and Linthicum, K. J., Appl. Phys. Lett., 91, 012110 (2007).Google Scholar
21 Kang, B. S., Wang, H.T., Ren, F., Pearton, S. J., Morey, T. E., Dennis, D. M., Johnson, J. W., Rajagopal, P., Roberts, J. C., Piner, E. L., and Linthicum, K. J., Appl. Phys. Lett., 91, 252103 (2007).Google Scholar
22 Kang, B. S., Wang, H.T., Lele, T. P., Tseng, Y., Ren, F., Pearton, S. J., Johnson, J. W., Rajagopal, P., Roberts, J. C., Piner, E. L., and Linthicum, K. J., Appl. Phys. Lett., 91, 112106 (2007).Google Scholar
23 Wang, H.T., Kang, B. S., Ren, F., Pearton, S. J., Johnson, J. W., Rajagopal, P., Roberts, J. C., Piner, E. L., and Linthicum, K. J., Appl. Phys. Lett., 91, 222101 (2007).Google Scholar
24 Hung, S. C., Wang, Y. L., Hicks, B., Pearton, S. J., Dennis, D. M., Ren, F., Johnson, J. W., Rajagopal, P., Roberts, J. C., Piner, E. L., Linthicum, K. J., and Chi, G. C., Appl. Phys. Lett., 92, 193903 (2008).Google Scholar
25 Chu, B. H., Kang, B. S., Ren, F., Chang, C. Y., Wang, Y. L., Pearton, S. J., Glushakov, A. V., Dennis, D. M., Johnson, J. W., Rajagopal, P., Roberts, J. C., Piner, E. L., and Linthicum, K. J., Appl. Phys. Lett., 93, 042114 (2008).Google Scholar
26 Wang, Yu-Lin, Chu, B. H., Chen, K. H., Chang, C. Y., Lele, T. P., Tseng, Y., Pearton, S. J., Ramage, J., Hooten, D., Dabiran, A., Chow, P. P., and Ren, F., Appl. Phys. Lett., 93, 262101 (2008).Google Scholar
27 Hung, S. C., Chu, B. H., Chang, C. Y., Lo, C. F., Chen, K. H., Wang, Y. L., Pearton, S. J., Dabiran, Amir, Chow, P. P., Chi, G. C., and Ren, F., Appl. Phys. Lett., 94, 043903 (2009).Google Scholar
28 Lupu, A., Valsesia, A., Bretagnol, F., Colpo, P., Rossi, F., Sensors and Actuators B, 127, 606 (2007).Google Scholar
29 Marquette, C.A., Degiuli, A., and Blum, L., Biosensors and Bioelectronics, 19, 433 (2003)Google Scholar
30 Zhang, A. P., Rowland, L. B., Kaminsky, E. B., Tilak, V., Grande, J. C., Teetsov, J., Vertiatchikh, A., and Eastman, L. F., J. Electron. Mater., 32, 388 (2003).Google Scholar
31 Ambacher, O., Eickhoff, M., Steinhoff, G., Hermann, M., Gorgens, L., Werss, V., Baur, B., Stutzmann, M., Neuterger, R., Schalwig, J., Muller, G., Tilak, V., Green, B., Schafft, B., Eastman, L. F., Bernadini, F., and Fiorienbini, V., Proceedings of the Electrochemical Society (Electrochemical Society, Pennington, NJ, 2002), p. 27.Google Scholar
32 Neuberger, R., Muller, G., Ambacher, O., and Stutzmann, M., Phys. Status Solidi A 185, 85 (2001).Google Scholar
33 Schalwig, J., Muller, G., Ambacher, O., and Stutzmann, M., Phys. Status Solidi A 185, 39 (2001).Google Scholar
34 Steinhoff, G., Hermann, M., Schaff, W. J., Eastman, L. F., Stutzmann, M., and Eickhoff, M., Appl. Phys. Lett., 83, 177 (2003).Google Scholar
35 Kang, B. S., Kim, S., Ren, F., Johnson, J. W., Therrien, R., Rajagopal, P., Roberts, J., Piner, E., Linthicum, K. J., Chu, S. N. G., Baik, K., Gila, B. P., Abernathy, C. R., and Pearton, S. J., Appl. Phys. Lett., 85, 2962 (2004).Google Scholar
36 Pearton, S. J., Kang, B. S., Kim, S., Ren, F., Gila, B. P., Abernathy, C. R., Lin, J., and Chu, S. N. G., J. Phys.: Condens. Matter 16, R961 (2004).Google Scholar
37 Steinhoff, G., Baur, B., Wrobel, G., Ingebrandt, S., Offenhauser, A., Dadgar, A., Krost, A., Stutzmann, M., and Eickhoff, M., Appl. Phys. Lett., 86, 033901 (2005).Google Scholar
38 Kang, B. S., Ren, F., Wang, L., Lofton, C., Tan, W., Pearton, S. J., Dabiran, A., Osinsky, A., and Chow, P. P., Appl. Phys. Lett., 87, 023508 (2005).Google Scholar
39 Gwo, S., Wu, C.-L., Shen, C.-H., Chang, W.-H., Hsu, T. M., Wang, J.-S., and Hsu, J.-T., Appl. Phys. Lett., 84, 3765 (2004).Google Scholar