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Development of Variable Temperature Scanning Microwave Microscope for High Throughput Materials Characterization

Published online by Cambridge University Press:  26 February 2011

Noriaki Okazaki ,
Sohei Okazaki ,
Ryota Takahashi ,
Makoto Murakami ,
Parhat Ahmet ,
Nobuyuki Kakiuchi ,
Hitoshi Furusho ,
Taito Nishino ,
Yutaka Furubayashi  and
Tomoteru Fukumura
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Noriaki Okazaki
Affiliation:
okazaki.noriaki@nims.go.jp, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, 3050044, Japan
Sohei Okazaki
Affiliation:
okazaki@chem.s.u-tokyo.ac.jp
Ryota Takahashi
Affiliation:
takahashi@oxide.msl.titech.ac.jp
Makoto Murakami
Affiliation:
murakami@umd.edu
Parhat Ahmet
Affiliation:
parhat.ahmet@nims.go.jp
Nobuyuki Kakiuchi
Affiliation:
kakiuchi@nissanchem.co.jp
Hitoshi Furusho
Affiliation:
furusyouh@nissanchem.co.jp
Taito Nishino
Affiliation:
nishino@nissanchem.co.jp
Yutaka Furubayashi
Affiliation:
furubayashi@ksp.or.jp
Tomoteru Fukumura
Affiliation:
fukumura@imr.tohoku.ac.jp
Yuji Matsumoto
Affiliation:
matsumoto@oxide.msl.titech.ac.jp
Masashi Kawasaki
Affiliation:
kawasaki@imr.tohoku.ac.jp
Toyohiro Chikyow
Affiliation:
chikyo.toyohiro@nims.go.jp
Hideomi Koinuma
Affiliation:
koinuma.hideomi@nims.go.jp
Tetsuya Hasegawa
Affiliation:
hasegawa@chem.s.u-tokyo.ac.jp
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Abstract

We developed a variable-temperature scanning microwave microscope (VT-SμM) that can perform high-throughput materials characterization in the temperature range between 4K and room temperature. As a sensor probe we used a high-Q coaxial cavity resonator, which was mounted on the low-temperature stage to allow variable-temperature measurements. We carried out systematic studies on the thermal degradation of the conducting polymers using the combinatorial libraries of polyaniline and polythiophene thin films, which showed rapid decrease of conductivity above 300C and 250C, respectively. The low-temperature performance of the VT-SμM was demonstrated by the measurement of composition-spread Nd1-xSrxMnO3 thin film, for which we succeeded in detecting the clear metal-insulator transition at 100K. We also propose a simple and easy method for the quantitative analysis of conductive thin films, by using the standard composition-spread thin films of Ti1-xNbxO2.

Keywords

scanning probe microscopy (SPM)electrical propertiesdielectric properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 894: Symposium LL – Combinatorial Methods and Informatics in Materials Science , 2005 , 0894-LL02-03
Copyright
Copyright © Materials Research Society 2006

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References

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