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Dielectric Properties of Organic-Inorganic Hybrids: PDMS-Based Systems

Published online by Cambridge University Press:  15 February 2011

G. Teowee ,
K. C. McCarthy ,
C. D. Baertlein ,
J. M. Boulton ,
S. Motakef ,
T. J. Bukowski ,
T. P. Alexander  and
D. R. Uhlmann
G. Teowee
Affiliation:
Donnelly Corporation, 4545 East Fort Lowell, Tucson, AZ 85712
K. C. McCarthy
Affiliation:
Donnelly Corporation, 4545 East Fort Lowell, Tucson, AZ 85712
C. D. Baertlein
Affiliation:
Donnelly Corporation, 4545 East Fort Lowell, Tucson, AZ 85712
J. M. Boulton
Affiliation:
Donnelly Corporation, 4545 East Fort Lowell, Tucson, AZ 85712
S. Motakef
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
T. J. Bukowski
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
T. P. Alexander
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
D. R. Uhlmann
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721.
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Abstract

Organic-inorganic hybrids, with tailorable properties via control of their chemistries, offer great potential for many optical, electrical and mechanical applications. PDMS-based materials have been fabricated, having low optical losses of < 0.15 dB/cm but the dielectric properties of these hybrids have rarely been explored or reported. In the present study, the dielectric properties of PDMS:SiO2:TiO2 films are explored as a function of composition and curing temperature using an impedance analyzer. Dielectric spectroscopy was also performed to investigate the dielectric relaxation and dispersion behaviors. Results indicate that εr at 1 MHz ranges from 3 to 5. Residual hydroxyl and alkoxy species in the films contribute to the overall polarizabilities especially at low frequencies ( < 100 kHz).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 435: Symposium V – Better Ceramics Through Chemistry VII , 1996 , 559
Copyright
Copyright © Materials Research Society 1996

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