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Excited State Electronic Interactions in Oligothiophenes with Novel Supramolecular Structure*

Published online by Cambridge University Press:  21 March 2011

R. Tubino ,
A. Borghesi ,
A. Sassella ,
C. Botta ,
W. Porzio ,
F. Della Sala ,
A. Di Carlo  and
P. Lugli
R. Tubino
Affiliation:
INFM and Dipartimento di Scienza dei Materiali, Università di Milano “Bicocca”, Milano, Italy
A. Borghesi
Affiliation:
INFM and Dipartimento di Scienza dei Materiali, Università di Milano “Bicocca”, Milano, Italy
A. Sassella
Affiliation:
INFM and Dipartimento di Scienza dei Materiali, Università di Milano “Bicocca”, Milano, Italy
C. Botta
Affiliation:
Istituto di Chimica delle Macromolecole, CNR, Milano, Italy
W. Porzio
Affiliation:
Istituto di Chimica delle Macromolecole, CNR, Milano, Italy
F. Della Sala
Affiliation:
INFM and Dipartimento di Ingegneria Elettronica, Università di Roma “Tor Vergata”, Roma, Italy
A. Di Carlo
Affiliation:
INFM and Dipartimento di Ingegneria Elettronica, Università di Roma “Tor Vergata”, Roma, Italy
P. Lugli
Affiliation:
INFM and Dipartimento di Ingegneria Elettronica, Università di Roma “Tor Vergata”, Roma, Italy
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Abstract

Molecular beam deposition of quaterthiophene oligomer on a single crystal of potassium acid phtalate yields thin films exhibiting a novel supramolecular organisation which has been determined by a combined study of X-ray diffraction and polarized optical transmission measurements. In this structure consisting of stacks of tilted H aggregates, a commensurate ratio between the KAP substrate and the overgrown oligothiophene layer (quasi-epitaxial growth) is attained. The samples are optically extremely anisotropic, with the projection of the molecular axis on the substrate surface perfectly aligned along the b crystallographic axis. Using these novel structural data, the optical properties are interpreted within the framework of the transition density approach.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 598: Symposium BB – Electrical, Optical, & Magenetic Properties...V , 1999 , BB3.48
Copyright
Copyright © Materials Research Society 1999

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Footnotes

*

Work partially supported by TMR-EUROLED program and by Italian CNR

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