Hostname: page-component-6bf8c574d5-w79xw Total loading time: 0 Render date: 2025-02-22T17:11:55.653Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving the Crystallization Resistance of Aluminum(III) 8-Hydroxyquinoline-Based Emitting Materials by Entropic Stabilization

Published online by Cambridge University Press:  10 February 2011

Keith A. Higginson ,
Baocheng Yang  and
Fotios Papadimitrakopoulos
Keith A. Higginson
Affiliation:
Nanomaterials and Optoelectronics Laboratory, Department of Chemistry, Polymer Science Program, Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
Baocheng Yang
Affiliation:
Nanomaterials and Optoelectronics Laboratory, Department of Chemistry, Polymer Science Program, Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
Fotios Papadimitrakopoulos
Affiliation:
Nanomaterials and Optoelectronics Laboratory, Department of Chemistry, Polymer Science Program, Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
Get access

Abstract

The morphological stability of evaporated films of aluminum(III) 8-hydroxyquinoline (Alq3) was investigated. Films which were found to be non-crystalline by x-ray diffraction upon deposition, crystallized rapidly upon annealing, especially where defects were present. Blends of Alq3with aluminum(III) 5-methyl-8-hydroxyquinoline were proposed for thermally stable amorphous emitting layers in light-emitting diodes. Films coevaporated at a 1:1 ratio did not show evidence of crystallization or phase separation even after long annealing periods at temperatures as high as 160°C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 561: Symposium F – Organic Nonlinear Optical Materials and Devices , 1999 , 179
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Tang, C. W. and VanSlyke, S. A., App. Phys. Lett. 51, 913 (1987).Google Scholar
2 Rothberg, L. J. and Lovinger, A. J., J. Mat. Res. 11, 3174–3187 (1996).Google Scholar
3 Sheats, J. R., Antoniadis, H., Hueschen, M., Leonard, W., Miller, J., Moon, R., Roitman, D., and Stocking, A., Science 273, 884 (1996).Google Scholar
4 Burrows, P. E., Forrest, S. R., and Thompson, M. E., Current Opinion Solid State Materials Science 2, 236 (1997).Google Scholar
5 Bradley, D., Current Opinion Solid State Materials Science 1, 789 (1996).Google Scholar
6 Tohma, T., in International Display Research Conference Proceedings, 1997, p. F–1.Google Scholar
7 Koene, B. E., Loy, D. E., and Thompson, M. E., Chem. Mat. 10, 2235–2250 (1998).Google Scholar
8 Shirota, Y., Kuwabara, Y., Inada, H., Wakimoto, T., Nakada, H., Yonemoto, Y., Kawami, S., and Imai, K., App. Phys. Lett. 65, 807 (1994).Google Scholar
9 Tokito, S., Tanaka, H., Noda, K., Okada, A., and Taga, Y., IEEE Trans. Elec. Dev. 44, 1239–1244 (1997).Google Scholar
10 Sturm, J. C., Wilson, W., and lodice, M., IEEE Journal of Selected Topics in Quantum Electronics 4, 75–82 (1998).Google Scholar
11 Zarzycki, J., Glasses and the Vitreous State (Cambridge Universtiy Press, Cambridge, UK, 1991).Google Scholar
12 Scott, M. G., in Amorphous Metallic Alloys, edited by Luborsky, F. E. (Butterworths, London, 1983), p. 144–168.Google Scholar
13 Davies, H. A., in Amorphous Metallic Alloys, edited by Luborsky, F. E. (Butterworths, London, 1983), p. 8–25.Google Scholar
14 Naito, K. and Miura, A., J. Phys. Chem. 97, 6240–6248 (1993).Google Scholar
15 Naito, K., Chem. Mater. 6, 2343–2350 (1994).Google Scholar
16 MacKnight, W. J., Karasz, F. E., and Fried, J. R., in Polymer Blends; Vol. 1, edited by Paul, D. R. and Newman, S. (Academic Press, San Diego, 1978), p. 186–243.Google Scholar
17 James, P. F., in Nucleation and Crystallization in Glasses; Vol. 4, edited by Simmons, J. H., Uhlmann, D. R., and Beall, G. H. (American Chemical Society, Columbus, OH, 1982), p. 1–47.Google Scholar
18 Kido, J., Chem. Lett., 963–964 (1997).Google Scholar
19 Wada, T., Yogo, Y., Kikuma, I., Masui, M., Anzai, M., and Takeuchi, M., App. Surface Sci. 65/66, 376–380 (1993).Google Scholar
20 Higginson, K. A., Zhang, X.-M., and Papadimitrakopoulos, F., Chem. Mater. 10, 1017–1020 (1997).Google Scholar