Hostname: page-component-6bf8c574d5-w79xw Total loading time: 0 Render date: 2025-02-22T16:32:07.275Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Quasi-Real Time Observations of the Deformation of α-Brass Bicrystals via Synchrotron X-Ray Topography

Published online by Cambridge University Press:  15 February 2011

Z. Zeng ,
Z. Rek  and
J. C. Bilello
Z. Zeng
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109-2136
Z. Rek
Affiliation:
Stanford Synchrotron Radiation Laboratory, Stanford University, CA 94309
J. C. Bilello
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109-2136
Get access

Abstract

Real-time studies of the deformation behavior of a-brass bicrystals were conducted via in-situ synchrotron white beam X-ray topography (SWBXRT). The object of this work was to understand the role of internal interfaces such as grain boundaries, in controlling the mechanical behavior of materials. A brass bicrystal, in which the two grains made 5° of tilt and 11° of twist with respect to each other was grown by the Bridgman method. Observations were performed by straining the bicrystal in a microtensile stage while stop-action X-ray diffraction topographs were taken. Slip initiated in the grain with the most favorable Schmid factor at a stress level of 1.4MPa which was 5% of the macroyield stress. Since the grain boundary acted as a barrier to slip, the next grain did not slip until the dislocation pile-up at the grain boundary reached a critical value.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 225
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hirth, J.P. and Lothe, J., Theory of Dislocations. (John Wiley and Sons Publishers, New York, 1982).Google Scholar
2. Chalmers, B., Proc. Roy. Soc. A162, 120 (1937).Google Scholar
3. Clark, R. and Chalmers, B., Acta Metall. 2, 80 (1954).Google Scholar
4. Hook, R.E. and Hirth, J.P., Acta Metall. 15, 535 (1967).Google Scholar
5. Chuang, Y.D. and Margolin, H., Metall. Trans. 4, 1905 (1973).CrossRefGoogle Scholar
6. Fekete, J.R. and Gibala, R., The Effect of the Grain Boundary on the Deformation Behavior of Tungsten Bicrystals, PhD thesis, University of Michigan, 1986.Google Scholar
7. Bilello, J.C., Schmitz, H.A., and Dew-Hughes, D., J. Appl. Phys. 65, 2282 (1989).Google Scholar
8. Tanner, B.K., X-ray Diffraction Toogarphy, Pergamon Press, Oxford, UK, (1976), p. 56.Google Scholar
9. Sauvage, M. and Petroff, J.F., in Synchrotron Radiation Research, edited by Winick, H. and Doniach, S. (plenum Press Publishers, 1980), p.607.Google Scholar
10. Gastaldi, J. and Jourdan, C., J. Cryst. Growth, 35, 17 (1976).Google Scholar
11. MacCormack, I.B. and Tanner, B.K., J. Appl. Cryst., 11, 40 (1978).Google Scholar
12. Gastaldi, J. and Jourdan, C., Phy. Stat. Sol., 49, 529 (1978).CrossRefGoogle Scholar
13. Gastaldi, J., Jourdan, C., Grange, G., and Bauer, C.L., Phys. Stat. Sol. A, 109,403 (1988).Google Scholar
14. Hmelo, A.B., Bilello, J.C., Davies, S.T., and Bowen, D.K., in Applications of X-Ray TopoIgaphic Methods to Materials Science, edited by Weissmann, S., Balibar, F., and Petroff, J. F., Plenum Press Publishers, New York, (1983), p.343.Google Scholar
15. Yao, G.D., Hou, S.Y., and Dudley, M., J. Mater. Res., 7, 1847 (1992).Google Scholar