Published online by Cambridge University Press: 10 February 2011
A kinetic model is presented to explain GaN growth. The model is based on established values for the N and Ga desorption kinetics and well founded assumptions on the adsorption and decomposition of the N and Ga containing precursors. When grown on similar nucleation layers, it is shown that high quality GaN films are achieved when the V/III ratio is chosen to be slightly larger than the Ga and N desorption rates. The model is verified by comparing the structural, optical, and electrical properties of the GaN to the growth temperature and V/III ratio. The model explains several features of GaN growth including, growth conditions for smooth surface morphology, growth conditions for highly resistive GaN, and a possible explanation for the origin of Ga and N vacancies in GaN. Based on the growth model, ordering of the GaN during growth is achieved via an adsorption/desorption cycle where Ga and N containing species are exchanged between the gas phase boundary layer and the solid surface. Consequences of the model on establishing growth conditions and run-to-run reproducability are also discussed.