Hostname: page-component-745bb68f8f-mzp66 Total loading time: 0 Render date: 2025-01-15T07:05:00.971Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructural Studies of Sputtered Co90Fe10/Ag GMR Multilayers

Published online by Cambridge University Press:  15 February 2011

J.D. Jarratt ,
T.J. Klemmer  and
J.A. Barnard
J.D. Jarratt
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama 35487–0202.
T.J. Klemmer
Affiliation:
The Center for Materials for Information Technology andThe University of Alabama, Tuscaloosa, Alabama 35487–0202.
J.A. Barnard
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama 35487–0202.
Get access

Abstract

The microstructure of Co90Feio/Ag giant magnetoresistive multilayer films has been investigated using x-ray diffraction (XRD) and cross-sectional transmission electron microscopy. Columnar grains with a (111) fiber growth texture is observed. A comparison is made between the observed layering structure and earlier multilayer schematics based on the literature and magnetic and magnetoresistive measurements as a function of layer thickness. A direct correlation is made between superlattice satellite peak signals from selected area electron diffraction patterns and XRD scans.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 475: Symposium M – Magnetic Ultrathin Films, Multilayers, and Surfaces – 1997 , 1997 , 351
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Jarratt, J.D. and Barnard, J.A., Mater. Res. Soc. Symp. Proc. 403, 719 (1996).Google Scholar
[2] Hylton, T.L., Coffey, K. R., Parker, M.A., and Howard, J.K., Science 261, 1021 (1993).Google Scholar
[3] Xiao, J. C, Jiang, J.S., and Chien, C.L., Phys. Rev. Lett. 68, 3749 (1992).Google Scholar
[4] Berkowitz, A. E., et al., Phys. Rev. Lett. 68, 3745 (1992).Google Scholar
[5] Mezey, L.Z. and Giber, J., Jpn. J. Appl. Phys. 21, 1569 (1982).Google Scholar
[6] Volmer, M. and Weber, A., Z. Phys. Chem. 119, 277 (1926).Google Scholar
[7] Jarratt, J.D. and Barnard, J.A., IEEE Trans. Mag. 32, 4698 (1996).Google Scholar
[8] van Alphen, E.A.M. and de Jonge, W.J.M., Phys. Rev. B 51, 8182 (1995).Google Scholar
[9] Loloee, R., Schroeder, P.A., Pratt, W.P. Jr, Bass, J., and Fert, A., Physica B 204, 274 (1995).Google Scholar
[10] Neél, L., Compt. Rend. Acad. Sci., 255, 1545 and 1676 (1962).Google Scholar