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Microwave Characterization of Materials Using a Vector Network Analyzer

Published online by Cambridge University Press:  15 February 2011

David Blackham  and
Roger Pollard
David Blackham
Affiliation:
Hewlett Packard, Microwave Instruments Division, 1400 Fountaingrove Parkway, Santa Rosa, CA 95403
Roger Pollard
Affiliation:
University of Leeds, Department of Electronic and Electrical Engineering, Leeds LS2 9JT, UK
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Abstract

The vector network analyzer provides a versatile tool for use in the microwave characterization of material permittivity and/or permeability. An understanding of network analyzer error sources can be leveraged into better measurement results. Vector error correction not only reduces the systematic errors but can also be used to remove the effects of dielectric dams in broadband transmission/reflection measurements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 209
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1. Vanzura, E.J. and Kissiek, W.A., in 1989 IEEE MTT-S International Microwave Symposium Digest, edited by Rüssel, K.J. (IEEE, New York, 1989), pp. 901–904.Google Scholar
2. Ramo, S., Whinnery, J.R., and Van Duzer, T., in Fields and Waves in Communication Electronics. 2nd ed. (John Wiley & Sons, New York, 1984), p. 671.Google Scholar
3. Altman, J.L., in Microwave Circuits, edited by Reich, H.J. (D. Van Nostrand Company, Inc., Princeton, New Jersey, 1964), pp. 202–257.Google Scholar
4. Vanzura, E. J. and Rogers, J.E., in IEEE Instrumentation and Measurement Technology Conference. (IEEE Press, New York, 1991), pp. 150–155.Google Scholar
5. Burdette, E.C., Cain, F.L., and Seals, J., IEEE Trans. Micr. Theory Tech. MTT-28 (4), 414–427 (1980).Google Scholar
6. Stuchly, M.A., Brady, M.M., Stuchly, S.S., and Gajda, G., IEEE Trans. Instrum. Measur. IM-31, (2), 116–119, (1982.).Google Scholar
7. Grant, J.P., Clarke, R.N., Symm, G.T., and Spyrou, N.M., J. Phys. E: Sci. Instrum. 22, 757–770 (1989).Google Scholar
8. Marsland, T.P. and Evans, S., IEEE Proceedings Pt. H, 134 (4), 341–349 (1987).Google Scholar
9. Misra, D.K., IEEE Trans. Micr. Theory Tech. IEEE-35 (10), 925–928 (1987).Google Scholar
10. Nicolson, A.M. and Ross, G.F., IEEE Trans. Instrum. Measur. IM-19 (4), 377–382 (1970).Google Scholar
11. Weir, W.B., Proc. IEEE 62 (1), 33–36, (1974.).Google Scholar
12. Baker-Jarvis, J., Vanzura, E. J., and Kissiek, W.A., IEEE Trans. Micr. Theory Tech. 38 (8), 1096–1103 (1990).Google Scholar
13. Baker-Jarvis, J., Janezic, M.D., Grosvenor, J.H.J., and Geyer, R.G., Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability. (U.S. Government Printing Office, Washington, 1992),.Google Scholar
14. Sequeira, H.B., Microwave Journal 34, 73–85 (March 1991).Google Scholar