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A Multi-Technique Analysis of MOCVD- Grown Lead Lanthanum Titanate (Pb1−xLax)TiO3 Thin Films on Quartz Substrates

Published online by Cambridge University Press:  10 February 2011

H. Y. Chen ,
J. Lin ,
K. L. Tan ,
Z. C. Feng ,
B. S. Kwak  and
A. Erbil
H. Y. Chen
Affiliation:
Department of Physics, National University of Singapore, Singapore 119260, phylinjy@nus.sg
J. Lin
Affiliation:
Department of Physics, National University of Singapore, Singapore 119260, phylinjy@nus.sg
K. L. Tan
Affiliation:
Department of Physics, National University of Singapore, Singapore 119260, phylinjy@nus.sg
Z. C. Feng
Affiliation:
EMCORE Corporation, Somerset, NJ
B. S. Kwak
Affiliation:
School of Physics, Georgia Institute of Technology, Atlanta, GA, U. S. A.
A. Erbil
Affiliation:
School of Physics, Georgia Institute of Technology, Atlanta, GA, U. S. A.
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Abstract

A series of Lead lanthanum titanate (Pb1−xLax)TiO3 thin films with different compositions of x = 0 − 0.33 have been grown on fused quartz substrates by metalorganic chemical vapor deposition (MOCVD) and analyzed by a variety of techniques including X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), Raman scattering spectroscopy (RSS) and diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) techniques. XPS results confirmed the film composition of (Pb1−x Lax)TiO3 and lanthanum enrichment in top surface layers. XRD indicates a preferred (100) orientation for the films with x values of 0.05–0.17, while the films with x values above 0.32 have randomly distributed orientations. A gradual change in the crystal structure from tetragonal to cubic arrangement with increasing La composition is noted. XPS data also show the variation of Ti-O, Pb-0 and La-0 bonding with the change in the La composition. The stretching vibrations corresponding to these oxygen related bonding are observed by DRIFT at 667, 826, 936 and 529 cm−1 respectively. This combined investigation on epitaxial PLT films may enhance our understanding of the ferroelectric PLT materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 493: Symposium U – Ferroelectric Thin Film VI , 1997 , 493
Copyright
Copyright © Materials Research Society 1998

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References

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