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Published online by Cambridge University Press: 01 February 2011
Room temperature near-infrared intersubband transitions were observed in MBE grown non-polar cubic GaN/AlN superlattice structures. The peak wavelengths of these transitions were observed in the spectral region of 1.5–2.0 μm and were theoretically supported using a transfer matrix approach. All samples were unintentionally doped and grown on 3C-SiC substrates with a 100 nm GaN buffer. Each structure consisted of a 20 periods of GaN/AlN superlattice capped with 100nm of GaN. The thickness of the AlN barrier was fixed at 1.35, while the thickness of the GaN well was varied between 1.6 and 2.1nm. Electrochemical Capacitance Voltage (ECV) measurements allowed direct measurement of the intrinsic carrier concentration in a thick unintentionally doped cubic GaN layer, which confirmed sufficient population of the ground state energy level.