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Published online by Cambridge University Press: 28 February 2011
We have been measuring x-ray diffraction spectra of small samples of layers in cross-sections using a Micro X-ray diffractometer (PSPC/MDG) system since 1988. In measuring with xray diffractometry, the position sensitive proportional counter (PSPC) covers 150 degrees of x-ray diffraction, continuously. The data are accumulated by the multichannel analyser (MCA) and monitored on a CRT during the measurement period. Mounted samples can rotate around three axes. The XRD spectra are very like those from a wide angle goniometer used in powder diffraction. Normally the spatial limits are around 30 microns in diameter, as we have found experimentallly in our samples. We feel this system is very feasible for art and archaeological studies. Some case studies are presented.