Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-10T12:29:14.075Z Has data issue: false hasContentIssue false

Organometallic CVD of CoGa and Related Bimetallic thin Films from Novel Single Source Precursors

Published online by Cambridge University Press:  22 February 2011

Roland A. Fischer*
Affiliation:
Anorganisch-chemisches Institut der Technischen Universität Miinchen, Lichtenbergstraβe 4, D-W8046 Garching, Germany.
Get access

Abstract

A series of volatile heterodinuclear organometallic compounds of the general formula L(CO)nM-ER1R2(D) (L = CO, η5-C5H5, P(CH3)3; n = 1–4; M = Mn, Fe, Co, Ni; E = Al, Ga, In; R = H, alkyl; D = O- or N-donor ligand) was syndiesized and characterized. These compounds exist either as low melting solids or liquids with vapor pressures typically around 10–50 mTorr at room temperature. The possibility to grow bimetallic thin films ME (e.g. CoAl, CoGa, Coin, Niln etc.) from those single source molecular precursors by thermally induced low pressure OMCVD was investigated. It was shown that the thin film composition, namely the metal stoichiometry, can be controlled by the ligand set at the metal atoms.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] For examples of work on single source precursors see: Maclnnes, A. N., Power, M. B., Barron, A. R., and references cited therein;Google Scholar
Maury, F., Adv. Mater. 3, 542 (1991);Google Scholar
Cowley, A. H.; Jones, R. A., Angew. Chem. Int. Ed. Engl. 28, 1208 (1990).Google Scholar
[2] Kaesz, H. D., Williams, R. S., Hicks, R. F., Zink, J. I., Chen, Y.-J., Müller, H.-J., Xue, Z., Xu, D., Shuh, D. K., Kim, Y. K., New J. Chem. 14, 527 (1990).Google Scholar
[3] Stauf, G. T., Dowben, P. A., Boag, N. M., De La Graza, L. M., Dowben, S. L., Thin Solid Films 156, 327 (1988).Google Scholar
[4] Czekaj, C. L., Geoffrey, G. L., Inorg. Chem. 27, 8 (1988).Google Scholar
[5] Baugh, D. A., Talin, A. A., Williams, R. S., Kuo, T.-C., Wang, K. L., J. Vac. Sci, Technol. B 9, 2154 (1991).Google Scholar
[6] Tanaka, M., Ikarashi, N, Sakakibara, H., Ishida, K., Nishinaga, T., Appl. Phys. Lett. 60, 835 (1992).Google Scholar
[7] Sands, T, Harbison, J. P., Chan, W. K., Schwarz, S. A., Chang, C. C., Palmstøm, C. J., Keramidas, V. G., Appl. Phys. Lett. 52, 1216 (1988).Google Scholar
[8] Sands, T., Appl. Phys. Lett. 52, 197 (1988).Google Scholar
[9] Guivarc'h, A., Secoué, M., Guenais, B., Appl. Phys. Lett. 52, 948 (1988).Google Scholar
[10] Maury, F., Talin, A. A., Kaesz, H. D., Williams, R. S., Appl. Phys. Lett. 61, 1075 (1992)Google Scholar
[11] Chen, Y.-J., Kaesz, H. D., Kim, Y.-K., MUller, H.-J., Williams, R. S., Xue, Z., Appl. Phys. Lett. 55, 2760 (1989).Google Scholar
[12] Boocock, S. K., Shore, S. G. in Comprehensive Organometallic Chemistry, edited by Wilkinson, G., Stone, F. G. A., Abel, E. W. (Pergamon, Oxford, 1982) Vol. 6, pp 947;Google Scholar
Compton, N. A., Errington, R. J., Norman, N. C., Adv. Organomet. Chem. 31, 91 (1990).Google Scholar
[13] Thorn, D. L., J. Organomet. Chem 405, 161 (1991) and references cited therein.Google Scholar
[14] Fischer, R. A., J. Behm, Chem. Ber. 125, 37 (1992).Google Scholar
[15] Fischer, R. A., Behm, J., Priermeier, Th., J. Organomet. Chem. 429, 275 (1992).Google Scholar
[16] Fischer, R. A., Behm, J., Herdtweck, E., Kronseder, C., J. Organomet. Chem. 437, C29 (1992).Google Scholar
[17] Greenwood, N. N., Storr, A., Wallbridge, M. G. H., Inorg. Chem. 2, 1036 (1963).Google Scholar
[18] Zinn, A., Niemer, B., Kaesz, H. D., Adv. Mater. 4, 375 (1992).Google Scholar
[19] Wunsch, K. M., Wachtel, E., Z. Metallkunde 73, 311 (1982).Google Scholar
[20] Schöbel, J.-D., Stadelmaier, H. H., Z. Metallkunde 61, 342 (1970).Google Scholar
[21] Piotrowska, A., Kaminska, E., Thin Solid Films, 193/194, 511 (1990).Google Scholar
[22] Andersson-Soederberg, M., J. Less-Common Met. 171, 179 (1991).Google Scholar
[23] Glass, J. A. Jr, Kher, S. S., Spencer, J. T., Chem. of Mater. 4, 530 (1992).Google Scholar
[24] Cohen, S. L., Liehr, M., Kasi, S., J. Vac. Sci. Technol. A 10, 863 (1992).Google Scholar