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Polyaniline Surface Morphology During The Doping Process Using Atomic Force Microscopy

Published online by Cambridge University Press:  16 February 2011

Leonard J. Buckley*
Affiliation:
Naval Research Laboratory, Washington, DC; Jack Y. Josefowicz and Like Xie, University of Pennsylvania, Philadelphia, PA.
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Abstract

Chemically synthesized polyaniline films were studied during the doping and dedoping process by imaging the polymer surface using in-situ Atomic Force Microscopy (AFM). The polymer, which was initially in the base non-conducting form was doped using aqueous acidic solutions of both tosylic (pH=0.2) and HCl (pH of 0.2 and 1.0). Dedoping was accomplished by exposing the same doped polymer surface to NH4OH (pH=12) base solution. AFM images showed that it was necessary to cycle the polymer surface 3 times between acid and base before a reproducible surface morphology was established between the doped and dedoped states. For the case of doping with tosylic acid AFM images showed that the polyaniline surface was immediately roughened. In addition there appeared to be an increase in the size of surface channels and cracks. When doping with HC1 (pH=1.0), no change in surface morphology was observed; however, noticeable surface roughening occurred over 10 Minutes for the case of the lower pH=0.2 solution. The complex permittivity and DC conductivity was measured to estimate the level of protonation in the AFM samples.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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