Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-14T05:39:23.232Z Has data issue: false hasContentIssue false

Red-Green-Blue MOSLED Made by PECVD Grown SiOx with Detuning RF Plasma Power

Published online by Cambridge University Press:  31 January 2011

Chih-Hsien Cheng
Affiliation:
shouham@hotmail.com, National Taiwan University, Institute of Photonics and Optoelectronics, and Department of Electrical Engineering, Taipei, Taiwan, Province of China
Bo-Han Lai
Affiliation:
f97941009@ntu.edu.tw, National Taiwan University, Institute of Photonics and Optoelectronics, and Department of Electrical Engineering, Taipei, Taiwan, Province of China
Gong-Ru Lin
Affiliation:
grlin@ntu.edu.tw, National Taiwan University, No. 1 Roosevelt Road Sec. 4, Taipei, 10617, Taiwan, Province of China
Get access

Abstract

Si quantum dot (Si-QD) based multi-color metal oxide semiconductor lighting emission diodes (MOSLEDs) made on Si-rich SiOx grown by detuning RF plasma power in a plasma enhanced chemical vapor deposition (PECVD) system are demonstrated. With the RF plasma powers increasing from 50 to 70 W at 10 W increment, the turn-on voltage and maximum electroluminescence (EL) power red-, green- and blue-color MOSLEDs increase from 70, 90 and 99 V and 7, 26 and 55 nW, respectively. The power-current slope of 0.51, 3.24 and 53.82 mW/A are obtained for these MOSLEDs with corresponding power conversion ratio (PCR) of 5.13×10-6, 2.52×10-5 and 2.47×10-4. Both the turn-on voltage and power slope linearly increase with enhancing thickness of the Si-QD based MOSLED.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

11. Linnros, J. and Lalic, N., Appl. Phys. Lett., vol. 66, pp. 3048 (1995).Google Scholar
2 Liu, Y., Chen, T.P., Ding, L., Yang, M., Wong, J.I., Ng, C.Y., Yu, S.F., Li, Z.X., and Yuen, C., J. Appl. Phys., vol. 101, 104306 (2007).Google Scholar
3 Wang, M., Huang, X., Xu, J., Li, W., Liu, Z., and Chena, K., Appl. Phys. Lett., vol. 72, pp. 722 (1998).Google Scholar
4 Jambois, O., Rinnert, H., Devaux, X., and Vergnat, M., J. Appl. Phys., vol. 98, 046105 (2005).Google Scholar
5 Lin, G.-R. and Lin, C.J., Appl. Phys. Lett., vol. 91, 072103 (2007)Google Scholar
6 Mead, C. A., Phys. Rev., vol. 128, pp. 2088 (1962).Google Scholar
7 Sze, S., J. Appl. Phy., vol. 38, pp. 2951 (1967).Google Scholar
8 Chen, J., Lee, T., Su, J., Wang, W., and Reed, M.A., Encyclopedia of Nanoscience and Nanotechnology (American Scientific Publishers, Valencia, California, 2004), 5, 633 (2004).Google Scholar