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Scanning Conduction Microscopy: A Method of Probing Abrasion of Insulating Thin Films on Conducting Substrates

Published online by Cambridge University Press:  15 February 2011

J. T. Dickinson  and
K. W. Hipps
J. T. Dickinson
Affiliation:
Department of Physics Washington State University, Pullman, WA 99164-2814
K. W. Hipps
Affiliation:
Department of Chemistry Washington State University, Pullman, WA 99164-2814
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Abstract

The use of Scanning Force Microscopy (SFM) to probe wear processes at interfaces is of considerable interest. We present here a simple modification of the SFM which allows us to make highly spatially resolved measurements of conductivity changes produced by abrasion of thin insulating films on metal substrates. The technique is demonstrated on fluorocarbon polymer thin films deposited on stainless steel substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 385: Symposium N – Polymer/Inorganic Interfaces II , 1995 , 221
Copyright
Copyright © Materials Research Society 1995

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References

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