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Published online by Cambridge University Press: 26 February 2011
The electroluminescent characteristics of multilayer structures involving Si C as the light emitting material are reported. The structures studieA have two types of multilayer stacks a) Si rich Si02/ Si02/- Six Cl v and b) Si rich SiO2 /Six C1-x, Both type of structures were deposite on an n-type silicon surstrt-e and conductive indium oxide was deposited on top of the structure to define the electroluminescent device. The light emitted spectra present two broad peaks at ∼530 and 670nm when an undoped Si C layer is integrated in the structure. However, when a boron dopedX SixC1-x is used, the light emission at larger wavelengths is dominant.