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Soft X-RAY Magnetic Scattering Study of thin Films and Multilayers

Published online by Cambridge University Press:  26 February 2011

C.-C. Kao ,
E.D. Johnson ,
J.B. Hastings ,
D.P. Siddons  and
C. Vettier
C.-C. Kao
Affiliation:
National Synchrotron Light Source Brookhaven National Laboratory, Upton New York 11973
E.D. Johnson
Affiliation:
National Synchrotron Light Source Brookhaven National Laboratory, Upton New York 11973
J.B. Hastings
Affiliation:
National Synchrotron Light Source Brookhaven National Laboratory, Upton New York 11973
D.P. Siddons
Affiliation:
National Synchrotron Light Source Brookhaven National Laboratory, Upton New York 11973
C. Vettier
Affiliation:
Institute Laue-Langevin, 38052 Grenoble CEDEX, France
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Abstract

A brief discussion of the resonant magnetic scattering process is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information can be obtained and the unique features of this technique: large resonant enhancement, sensitivity to magnitization, elemental specificity, and tunability of the penetration depth. Comparison is made with related techniques: magneto-optical Kerr effect, Faraday effect, and magnetic circular dichroism.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 231: Symposium S – Magnetic Surfaces, Thin Films and Multilayers , 1991 , 27
Copyright
Copyright © Materials Research Society 1992

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References

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