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The Spectroscopy and Surface Chemistry of Metal-Alkyl Molecules

Published online by Cambridge University Press:  25 February 2011

P. Shaw
Affiliation:
Microlectronics Sciences Laboratories, Columbia University, New York, NY 10027
J. O'Neill
Affiliation:
Microlectronics Sciences Laboratories, Columbia University, New York, NY 10027
E. Sanchez
Affiliation:
Microlectronics Sciences Laboratories, Columbia University, New York, NY 10027
Z. Wu
Affiliation:
Microlectronics Sciences Laboratories, Columbia University, New York, NY 10027
R.W. Osgood Jr.
Affiliation:
Microlectronics Sciences Laboratories, Columbia University, New York, NY 10027
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Abstract

metal-alkyl molecules provied an early source molecule for photodeposition of metal. They continue to be of interest for patterned and unpatterned laser deposition and for conctact formation on compound semiconductors. This article provides a brief review of what has been learned about the surface photo-physic of this class of molecules based on several years of study with uV and iR absorption spectroscopy, UHV surface analysis, and thermal and photodesorption amass spectroscopy.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Deutsch, T. F., Ehrlich, D. J., and Osgood, R. M., Appl. Phys. Lett. 35, 175 (1979).CrossRefGoogle Scholar
2. Ehrlich, D. J., Osgood, R. M., and Deutsch, T. F., Appl. Phys. Lett. 36, 916 (1980).Google Scholar
3. Deutsch, T. F., Ehrlich, D. J., Osgood, R. M., and Liau, Z. L., Appl. Phys. Lett. 36, 847 (1980).CrossRefGoogle Scholar
4. Ehrlich, D. J., Tsao, J. Y., Silversmith, D. J., Sedlacek, J. H., Graber, W. S., Mountain, R., IEEE Elect. Device Lett., EDL–5, 32 (1984).CrossRefGoogle Scholar
5. Ehrlich, D. J., Deutsch, T. F., Silversmith, D. J., and Osgood, R. M., Elect. Dev. Lett. EDL–l, 101 (1980).Google Scholar
6. Cacouris, T., Krchnavek, R. R., Gilgen, H. H., Osgood, R. M., Kulick, S., and Schoen, J., Proceedings of the IEDM (1985).Google Scholar
7. Ehrlich, D. J. and Osgood, R. M., and Deutsch, T. F., J. Vac. Sci. Technol. 20, 738 (1982).CrossRefGoogle Scholar
8. Ehrlich, D. J., Osgood, R. M., and Deutsch, T. F., Appl. Phys. Lett. 38, 1 (1981).Google Scholar
9. For a series of studies on TMAI the reader is refered to G. Higashi and references cited therein.Google Scholar
10. Yu, C. F., Youngs, F., Tsukiyana, K., Bersohn, R., and Preses, J., J. Chem. Phys., 85, 1382 (1986).Google Scholar
11. Chu, J. O., Flynn, G. W., Chen, C. J., and Osgood, R. M., Chem. Phys. Lett. 119, (1985).Google Scholar
12. Ehrlich, D. J. and Osgood, R. M., Chem. Phys. Lett. 79, 381 (1981).Google Scholar
13. Chen, C. J. and Osgood, R. M., Chem. Phys. Lett. 98, 363 (1983).Google Scholar
14. Sanchez, E., Shaw, P., O'Neill, J. and Osgood, R. M., Chem. Phys. Lett. 147, 153 (1988).CrossRefGoogle Scholar
15. Stinespring, C. D. and Freedman, A., Chem. Phys. Lett. 143, 584 (1988).Google Scholar
16. Shaw, P. S., Sanchez, E., Wu, Z., and Osgood, R. M., Chem. Phys. Lett., 151, 449 (1988).Google Scholar
17. Walsh, J., J. Chem. Soc. 2260 (1953).Google Scholar
18. Chen, C. J. and Osgood, R. M., J. Chem Phys., 81, 327 (1984).Google Scholar
19. Krchnavek, R. R., Gilgen, H. H., Chen, J. C., Shaw, P. S., Licata, T. J. and Osgood, R. M. Jr., J. of Vac. Sci. and Tech., 5, 20 (1987).Google Scholar
20. Little, L. H., Infrared Spectra of Adsorbed Species, (Academic Press, NY, 1966).Google Scholar