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Structural Characterization of a Functionalized Organic Semiconductor
Published online by Cambridge University Press: 01 February 2011
Abstract
We report the structure of 5,5′-bis(4-hydroxyhexylphenyl)-2,2′-bithiophene (HO6PTTP60H) powder and sublimated films studied by X-ray diffraction (XRD) and Infrared absorption spectroscopy (IRAS). From XRD, herringbone packing is observed for the HO6PTTP60H powder. Different layer spacing is found for the powder (33.1Å) and the sublimated film (26.5Å). This slight difference indicates that the HO6PTTP60H molecule is tilted in the film. IRAS results confirm the presence of the HO6PTTP6OH molecule on the surface and its good stability over a few days.
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- Copyright © Materials Research Society 2005