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Studying Structure of Metallic Superlattices by "Symmetric" and "Asymmetric" X-rAY Diffraction

Published online by Cambridge University Press:  15 February 2011

G. Gladyszewski ,
Ph. Goudeau ,
K.F. Badawi  and
A. Naudon
G. Gladyszewski
Affiliation:
Institute of Physics, Marie Curie-Sklodowska University, pl. M. Curie-Sklodowskiej 1, 20-031 Lublin, POLAND.
Ph. Goudeau
Affiliation:
Laboratoire de Métallurgie Physique (Associé au CNRS, URA 131), Université de Poitiers, 40, Avenue du Recteur Pineau, 86022 Poitiers CEDEX, FRANCE.
K.F. Badawi
Affiliation:
Laboratoire de Métallurgie Physique (Associé au CNRS, URA 131), Université de Poitiers, 40, Avenue du Recteur Pineau, 86022 Poitiers CEDEX, FRANCE.
A. Naudon
Affiliation:
Laboratoire de Métallurgie Physique (Associé au CNRS, URA 131), Université de Poitiers, 40, Avenue du Recteur Pineau, 86022 Poitiers CEDEX, FRANCE.
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Abstract

"Symmetric" and "asymmetric" x-ray diffraction measurements are proposed as a tool for quantitative and complete determination of the superlattice structure. A general procedure which takes into account the atomic structure of the sublayers as well as structural disorder are presented. The "asymmetric" geometry using the "sin2psi" method is particularly emphasized.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 308: Symposium M1 – Thin Films: Stresses and Mechanical Properties IV , 1993 , 737
Copyright
Copyright © Materials Research Society 1993

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References

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