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Published online by Cambridge University Press: 10 February 2011
Real time in-situ laser reflectometry was used to investigate changes in surface morphology observed during the nucleation of oriented diamond on Ni in a hot filament chemical vapor deposition reactor. Characteristic features observed in the intensities of reflected and scattered light were interpreted by comparison with scanning electron micrographs of the diamond seeded substrates quenched at sequential stages of the process. Based on this analysis, a process was developed in which the scattered light signal was used as a steering parameter. Using this process, oriented nucleation and growth of diamond on Ni can be repeatedly achieved. For the purpose of both countering the loss of carbon atoms and to maximize the density of oriented diamond, different concentrations of methane were added during the high temperature annealing stage to find the optimized conditions. It was found that 0.5% methane in the gas phase produced the best degree of orientation and uniformity. Substrates nucleated at these conditions were grown out into coalesced, 30 μm thick films. Both, (100) and (111) oriented films showed a high degree of orientation. Raman spectra obtained from each orientation showed an intense and narrow diamond signature peak with negligible sp2 carbon or background luminescence.