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Adamantane Derivative as Host Material for Efficient Deep-Blue Phosphorescent Organic Light Emitting Diodes

Published online by Cambridge University Press:  31 January 2011

Hirohiko Fukagawa
Affiliation:
fukagawa.h-fe@nhk.or.jp, Japan Broadcasting Corporation (NHK), Science & Technical Research Laboratories, Tokyo, Japan
Norimasa Yokoyama
Affiliation:
nyokoyama@hodogaya.co.jp, Hodogaya Chemical Co. Ltd., Tsukuba, Japan
Shiro Irisa
Affiliation:
s-irisa@hodogaya.co.jp, Hodogaya Chemical Co. Ltd., Tsukuba, Japan
Shizuo Tokito
Affiliation:
tokito.s-eu@nhk.or.jp, Japan Broadcasting Corporation (NHK), Science & Technical Research Laboratories, Tokyo, Japan
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Abstract

We report on a high efficiency deep-blue phosphorescent organic light-emitting diode (POLED) based on new electron-transporting host material. The new electron-transporting host material is an adamantane derivative with high triplet energy and high electron mobility. The deep blue POLED that we have developed utilizes a deep-blue phosphorescent guest material, iridium(III)bis(4’,6’,-difluorophenylpyridinato)tetrakis(1-pyrazolyl)borate, and exhibits a power efficiency of about 10.2 lm/W at luminance of 100 cd/m2 and maximum external quantum efficiency (EQE) of about 13 %. The power efficiency of our POLED is much higher than that of POLED using p–bis(triphenylsilyly)benzene (UGH2). The maximum EQE of our POLED was also slightly more than that of POLED using UGH2. The obtained difference in power efficiency originates from the new host material having higher electron mobility than that of UGH2.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

1 Baldo, M. A., O'Brien, D. F., You, Y., Shoustikov, A., Sibley, S., Thompson, M. E., and Forrest, S. R., Nature (London) 395, 151 (1998).Google Scholar
2 Baldo, M. A., Thompson, M. E., and Forrest, S. R., Nature (London) 403, 750 (2000).Google Scholar
3 Adachi, C., Baldo, M. A., Thompson, M. E., and Forrest, S. R., J. Appl. Phys. 90, 5048 (2001).Google Scholar
4 Pfeiffer, M., Forrest, S. R., Leo, K., and Thompson, M. E., Adv. Mater. (Weinheim, Ger.) 14, 1633 (2002).Google Scholar
5 Watanabe, S., Ide, N., and Kido, J., Jpn. J. Appl. Phys., Part 1 46, 1186 (2007).Google Scholar
6 Jeon, S. O., Yook, K. S., Joo, C. W., Lee, J. Y., Ko, K. Y., Park, J. Y., and Baek, Y. G. Appl. Phys. Lett., 93, 063306 (2008).Google Scholar
7 Adachi, C., Kwong, R. C., Djurovich, P., Adamovich, V., Baldo, M. A., Thompson, M. E., and Forrest, S. R., Appl. Phys. Lett. 79, 2082 (2001).Google Scholar
8 Tanaka, D., Agata, Y., Takeda, T., Watanabe, S., and Kido, J., Jpn. J. Appl. Phys. 46, L117 (2007)Google Scholar
9 Holmes, R. J., D'Andrade, B. W., Forrest, S. R., Ren, X., Li, J., and Thompson, M. E., Appl. Phys. Lett. 83, 3818 (2003).Google Scholar
10 Zheng, Y., Eom, S. H., Chopra, N., Lee, J., So, F., and Xuea, J., Appl. Phys. Lett. 92, 223301 (2008).Google Scholar
11 Eom, S. H., Zheng, Y., Chopra, N., Lee, J., So, F., and Xuea, J., Appl. Phys. Lett. 93, 133309 (2008).Google Scholar
12 Eom, S. H., Zheng, Y., Wrzesniewski, E., Lee, J., Chopra, N., So, F., and Xue, J., Org. Electron., 10, 686 (2009).Google Scholar
13 Holmes, R. J., Forrest, S. R., Tung, Y.-J., Kwong, R. C., Brown, J. J., Garon, S., and Thompson, M. E., Appl. Phys. Lett. 82, 2422 (2003).Google Scholar
14 Tsai, M. H., Lin, H. W., Su, H. C., Ke, T. H., Wu, C.C., Fang, F.C., Liao, Y. L., Wong, K. T., and Wu, C. I, Adv. Mater. (Weinheim, Ger.) 18, 1216 (2006).Google Scholar
15 Fukagawa, H., Watanabe, K., Tsuzuki, T., and Tokito, S., Adv. Mater. (Weinheim, Ger.) 93, 133312 (2008).Google Scholar
16 Yang, C. H., Cheng, Y. M., Chi, Y., Hsu, C. J., Chou, P. T., Chang, C. H., and Wu, C. C., Angew. Chem., Int. Ed. 46, 2418 (2007).Google Scholar
17 Tokito, S., Iijima, T., Suzuri, Y., Kita, H., Tsuzuki, T., and Sato, F., Appl. Phys. Lett. 83, 2459 (2003).Google Scholar